11 results about "Serial presence detect" patented technology

Embodiments of the present disclosure provide a method and apparatus for reporting asset information, a non-transitory computer readable storage medium, and an electronic device. The method for reporting asset information includes: reading, in a case where a target device supports memory expansion, Serial Presence Detect (SPD) information of a designated memory bank mounted to the target device from a configuration space register of a Memory Expander Controller (MXC) of the target device by means of a Basic Input Output System (BIOS), wherein the target device is a device that supports a Computer Express Link (CXL) protocol, which is an open interconnection standard; and reporting, in a case where target SPD information has been read, the target SPD information to a Central Processing Unit (CPU) of the target device as system asset information by means of the BIOS.

The invention discloses a memory device management method and device, and relates to the field of computers.The method comprises the steps that field data of N bytes are extracted from serial existence detection data of a server memory device, and the bytes comprise key fields such as manufacturer numbers, production place information, production years, production weeks and serial numbers; and the target sequence identifier is generated according to the preset rule combination, and the identifier completely reflects physical factory information such as a manufacturer, a production place, time and a unique serial number of the memory device, so that the purpose of unifying memory sequence identifier display is achieved, and the technical effect that complete memory information can be accurately checked in real time without physically disassembling a server is achieved. The operation and maintenance efficiency of the server is improved, the hardware management cost is reduced, and the reliability and applicability of the system are enhanced.

The present application provides a memory device supporting multiple serial presence detection settings. The device includes a sequence presence detection module disposed on a substrate and electrically connected to a plurality of memory units. The sequence presence detection module is electrically connected to a storage element, including a first memory setting data and a second memory setting data respectively support a first processor and a second processor, which are different computational processing circuits. When the sequence presence detection module is electrically connected to a respective processor of the first processor and the second processor, the sequence presence detection module correspondingly reads a respective memory setting of the first memory setting data and the second memory setting data to support the respective processor.

The embodiment of the application provides a HSA pin resistance value selection method, device and computer readable storage medium, and relates to the chip technical field.The method internally arranges a nonvolatile memory in a serial presence detect hub, and utilizes the nonvolatile memory to persistently save a HID (HID is an abbreviation of High Definition) which can normally work at low temperature, normal temperature and high temperature, that is, an optimal HID.In use of the serial presence detect hub, a user can directly acquire the optimal HID in the nonvolatile memory of the serial presence detect hub, and access preset resistance values corresponding to the optimal HID to the HSA pin of the serial presence detect hub, so that the test time of the user is saved, and the use experience of the user is improved.

This application discloses a memory testing method and electronic device, relating to the field of memory testing technology. The method includes: dynamically configuring the testing environment based on the serial presence detection parameters of the memory under test, ensuring precise matching of testing criteria with memory specifications, significantly improving the accuracy and relevance of the test; simultaneously, by comparing power supply parameters and serial presence detection parameters in real time, dynamic adjustment of the protection threshold is achieved, which avoids accidental interruptions, ensures test continuity, and can respond promptly to real anomalies, effectively improving testing efficiency and reducing the risk of memory damage.

The invention discloses a memory testing method and electronic equipment, and relates to the technical field of memory testing, and the memory testing method comprises the steps that a testing environment is dynamically configured according to serial existence detection parameters of a to-be-tested memory, so that a testing criterion is accurately matched with a memory specification, and the testing accuracy and pertinence are remarkably improved; meanwhile, dynamic adjustment of the protection threshold is achieved by comparing the power supply parameters with the serial existence detection parameters in real time, mistaken interruption is avoided, the test continuity is guaranteed, response can be made in time when real abnormity occurs, the test efficiency is effectively improved, and the memory damage risk is reduced.

An active information display dynamic memory module is disclosed. The active information display dynamic memory module involves a microcontroller unit; a serial presence detect hub, electrically connected to the microcontroller unit; and a display panel, electrically connected to the microcontroller unit. Thereby, for DRAM modules under the JEDEC specification, new functional circuits on the circuit layout on the circuit carrier board is designed through designing customized microcontroller units. Through firmware design, the microcontroller unit is electrically connected to the serial presence detect hub and the display panel and controlled to actively display the specification and information of memory modules of different models.

A system includes a memory module and an SPD writer. The memory module includes a first memory device having a first capacity, and a serial presence detect (SPD) device configured to store data of the memory module. The SPD writer is configured to change the data according to a capacity of the memory module. The SPD writer includes a test pad configured to measure a first voltage signal generated by a controller. After the first memory device is replaced by a second memory device having a second capacity different from the first capacity, the test pad measures the first voltage signal.

The application discloses a memory SPD information recovery method and device and a computing device, and relates to the technical field of computers.The method comprises the following steps: acquiring serial presence detect (SPD) information of each memory, each memory having identification information for representing the specifications of the memory, and the identification information and the SPD information of the memory of the same specifications being the same; when a fault memory with erroneous SPD information exists, recording first identification information of the fault memory, and determining target identification information from second identification information corresponding to the memory with non-erroneous SPD information, the target identification information being the same as the first identification information of the fault memory; and re-determining target SPD information corresponding to the target identification information as the SPD information of the fault memory. In this way, after the information of the fault memory with the SPD information variation is recovered, the fault memory can still be normally used because the hardware of the memory itself is not faulty, and the normal start of the system is no longer affected, so that the fault tolerance performance of the system is improved.

A method and apparatus for adjusting a memory capacity, an electronic device, and a storage medium are provided by embodiments of the present application. The method includes: reading serial presence detect (SPD) data of a target memory from a basic input output system (BIOS) image of a BIOS, wherein the SPD data is reserved and the target memory is a physical memory without an SPD controller; and adjusting a memory capacity of the target memory based on the SPD data of the target memory. In the embodiments of the present application, dynamic adjustment on the memory capacity without SPD controllers may be achieved and dynamic adjustment on the memory capacity of an overall server without manually disassembling the memory modules of the server may be met, actual business needs of customers are met, the service life of memories is prolonged, and operation and maintenance costs are reduced.

A serial presence detect (SPD) device includes a region of nonvolatile memory for SPD data and an additional region for other (e.g., vendor) use. The additional region may be subdivided into write protect regions that can be individually and independently write protected. To configure the write protection, a password key scheme is used to enter a mode whereby the write protection attributes may be configured. Another password key scheme is used to exit the write protection configuration mode.