Resistance value measuring method and device or capacitance value measuring method and device

A technology for measuring devices and resistance values, applied in the directions of measuring devices, measuring electrical variables, measuring resistance/reactance/impedance, etc., can solve problems such as limiting application fields, adding external AD converters, increasing hardware costs, etc., to broaden the scope of application , cost reduction, low hardware cost effect

Active Publication Date: 2010-07-28
HUAWEI DEVICE CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The inventor found in the process of realizing the present invention that the prior art has at least the following deficiencies: the resistance measurement method of the prior art needs to be configured with pins with AD conversion functions, and in some low-end chips without AD conversion functions, or AD conversion This measurement method cannot be implemented in the case/scene

Method used

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  • Resistance value measuring method and device or capacitance value measuring method and device
  • Resistance value measuring method and device or capacitance value measuring method and device
  • Resistance value measuring method and device or capacitance value measuring method and device

Examples

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Embodiment 1

[0024] Embodiment 1 of the present invention provides a resistance measuring device and method.

[0025] figure 2 It is a functional block diagram of the resistance measuring device according to Embodiment 1 of the present invention. Such as figure 2 As shown, the device 10 includes:

[0026] An integrated circuit IC110, the IC110 includes an input / output I / O port 111 with an interrupt detection function and a timer (not shown), for obtaining the timing result of the timer, and generating the resistance to be measured according to the timing result The resistance value of device 121;

[0027] Charge and discharge circuit 120, the charge and discharge circuit 120 is composed of a resistor 121 to be tested and a capacitor 122 in series, and one end of the charge and discharge circuit 120 is coupled to the I / O port of the IC, the charge and discharge circuit 120 The other end is grounded;

[0028] Such as figure 2 As shown, one end of the resistor 121 to be tested is cou...

Embodiment 2

[0067] Embodiment 2 of the present invention provides a capacitance measuring device and method.

[0068] Figure 5 It is a functional block diagram of the capacitance measuring device according to Embodiment 2 of the present invention. Such as Figure 5 As shown, the device 20 includes:

[0069] An integrated circuit IC210, the IC210 includes an input / output I / O port 211 with an interrupt detection function and a timer (not shown), for obtaining the timing result of the timer, and generating the waiting time according to the timing result Measure the capacitance value of capacitor 222;

[0070] Charge and discharge circuit 220, the charge and discharge circuit 220 is composed of a resistor 221 and the capacitor 222 to be tested in series, and one end of the charge and discharge circuit 220 is coupled to the I / O port 211 of the IC, the charge and discharge The other end of the circuit 220 is grounded;

[0071] Such as Figure 5 As shown, one end of the resistor 221 is co...

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PUM

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Abstract

The embodiment of the invention provides resistance value or capacitance value measuring method and device. The resistance value measuring device comprises an integrated circuit (IC) and a charging and discharging circuit, wherein the IC comprises a timer and an I/O (input/output) port with a break detection function, and the IC is used for acquiring the timing result of the timer and generating the resistance value of a resistor to be measured according to the timing result; the charging and discharging circuit is formed by connecting the resistor to be measured and a capacitor in series, one end of the charging and discharging circuit is coupled with the I/O port of the IC, and the other end of the charging and discharging circuit is grounded; the IC charges the capacitor through the I/O port and the resistor to be measured, and when the capacitor is in a charging saturation state, the IC controls the timer to begin timing, triggers the capacitor for executing the discharging process and starts the break detection function of the I/O port; and when the I/O port detects that the voltage value of the capacitor reaches the threshold value of break of trigger voltage in the discharging process of the capacitor, the I/O port is used for sending a break signal to the IC to trigger the IC for controlling the timer to stop timing. The device realizes the measurement of the resistance value with lowest hardware cost.

Description

technical field [0001] The invention relates to the field of electrical measurement and testing, in particular to a resistance value measurement method and device, and a capacitance value measurement method and device. Background technique [0002] At present, the measurement of resistance value is mainly based on the use of GPIO (General Purpose Input Output, general purpose input and output interface) with AD (Analog-to-Digital, analog-to-digital conversion) conversion function, and is obtained by means of resistance voltage division measurement. corresponding resistance value. However, in some low-end chips, or when the AD conversion pins are not enough, the resistance value measurement cannot be performed. [0003] figure 1 Circuit diagram for prior art resistance value measurement. Such as figure 1 As shown, the resistance value measurement method in the prior art is implemented by software, mainly based on AD conversion, that is, the voltage measurement value betwe...

Claims

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Application Information

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IPC IPC(8): G01R27/02G01R27/26
Inventor 欧鹏
Owner HUAWEI DEVICE CO LTD
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