Photometric method and device

Abstract

The invention discloses a spectrophotometer device for improving the accuracy of photometric measurement. The device comprises 2n reflectors, a sample and a detector; wherein n reflectors are arranged on a reference optical path, n reflectors are arranged on a sample optical path, wherein n is 0 or a positive integer; the sample is arranged on the sample optical path; the detector is used for receiving the light from the reference optical path and the light from the sample optical path, and detecting the light intensity value of the reference optical path and the sample optical path; the n reflectors on the reference optical path are used for enabling the light from the reference optical path to enter the detector after being reflected for n times; and the n reflectors and the sample on the sample optical path are used for enabling the light from the sample optical path to enter the detector after being reflected for n times and transmitted by the sample for once, or enabling the light form the sample optical path to enter the detector after being reflected for n times and reflected by the sample for once. The invention also discloses a method for realizing the device.

Description

technical field [0001] The invention relates to the field of optics, in particular to a photometric measurement method and device. Background technique [0002] A spectrophotometer is the most commonly used device for measuring reflectance, transmittance, and scattering of samples. At present, most spectrophotometers use a dual beam structure: one beam passes through the sample and the other beam passes through the reference object. The ratio of the light intensity passing through the sample to the reference object is defined as the reflectance or transmittance or scattering rate of the film-based system. The spectrophotometer has two sets of light intensity detectors, one is a standard detector and the other is an integrating sphere. [0003] In the prior art, when using a standard detector, the sample is placed in the sample chamber, see figure 1 In the sample shown in 106, 101, 102, 103, and 104 are identical aluminum mirrors, and 105 is the same aluminum mirror as 101...

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Problems solved by technology

[0005] In summary, the reflectance measured by the standard detector and the reflectance and transmittance measured by the integrating sphere are the relative reflectance and relative transmittance of the sample relative to the aluminum mirror, rather than the real reflectance of the sample itself. Therefore, the measurement results cannot Accurately reflect the optical properties of the sample

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