Method and device for generating interfering noise and method and system for testing voltage tolerance

Abstract

The invention provides method and device for generating interfering noise and method and system for testing voltage tolerance. The method for generating interfering noise comprises the following steps of: generating at least one path of signals according to work frequency of a circuit to be tested; summing the generated at least one path of signals; and amplifying the summed signals to obtain interfering noise, wherein the voltage value of the interfering noise is equal to a design value of the voltage tolerance of the circuit to be tested. The device for generating interfering noise comprises a signal generating module, a summing device and an amplifier. The invention can generate interfering noise which is suitable for testing the voltage tolerance and can test whether the actual voltage tolerance of the circuit conforms to a design requirement.

Description

technical field [0001] Embodiments of the present invention relate to communication technology, and in particular to a method and device for generating interference noise and a method and system for testing voltage tolerance. Background technique [0002] Electronic products are always disturbed by various noises in actual work, for example, noise interference from power supply, telecommunication ports, space radiation, static electricity, etc. Noise interference is likely to cause the product to work abnormally, causing data packet loss and other problems in the product, or even crashing. [0003] In order to improve the anti-interference ability of electronic products, the voltage tolerance is designed for electronic products. In digital circuits, there are two types of voltage tolerances, namely high-level voltage tolerance and low-level voltage tolerance. see figure 1 , high-level voltage tolerance = VOH min-VIH min, low-level voltage tolerance = VIL max-VOL max, wher...

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Problems solved by technology

[0006] It can be seen from the above description that the existing technology generates interference noise arbitrarily when generating interference noise for testing voltage tolerance, without considering the characteristics of voltage tolerance, and using this interference noise to interfere with electronic products, then It cannot accurately detect whether the actual voltage tolerance of electronic products meets the design requirements, so that it is impossible to accurately estimate the anti-interference ability of the products

[0007] Moreover, electronic products include many circuits, and the method of testing the complete electronic product with the existing technology can only obtain whether the complete electronic product meets the design requirements of the voltage tolerance, but cannot obtain the actual voltage of a specific circuit in the electronic product Whether the tolerance meets the design requirements of the voltage tolerance, so that it is impossible to find out the circuit whose voltage tolerance does not meet the design requirements, which greatly reduces the test efficiency and cannot meet the diverse test requirements

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