Laser and image-based leaf area measurement device
Patent Information
- Authority / Receiving Office
- CN ยท China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- NANJING UNIV OF INFORMATION SCI & TECH
- Publication Date
- 2011-02-23
- Estimated Expiration
- Not applicable ยท inactive patent
Smart Images
Figure 1 Figure 2 Figure 3
Abstract
Description
Technical field
[0001] The invention belongs to the field of measurement of crop growth information in a greenhouse environment, and relates to a measurement device based on lasers and images. Background technique
[0002] Crop leaf area parameter is an important crop growth parameter. This parameter can be used to calculate the water consumption, transpiration and yield of the crop. Therefore, the leaf area parameter can be used to analyze the growth status of plants, establish plant growth models, and further master plant leaves The growth law of the plant has positive significance for guiding production and formulating high-yield, high-quality and efficient cultivation techniques. The current leaf area measurement methods mainly include leaf weighing method, square method, regression equation method, leaf area meter method, digital image method, etc. The weighing method and the square method have high measurement accuracy, but the leaves need to be picked and weighed, which w...