Leaf area measuring method based on lasers and images
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- NANJING UNIV OF INFORMATION SCI & TECH
- Publication Date
- 2015-03-25
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The invention belongs to the field of measurement of crop growth information in a greenhouse environment, and relates to a measurement method based on laser light and images. Background technique
[0002] The crop leaf area parameter is an important crop growth parameter, which can be used to calculate the water consumption, transpiration and yield of the crop, so the leaf area parameter can be used to analyze the growth status of the plant, establish a plant growth model, and further grasp the plant leaf area. It has positive significance for guiding production and formulating technical measures for high-yield, high-quality and high-efficiency cultivation. At present, the leaf area measurement methods mainly include leaf weighing method, grid method, regression equation method, leaf area meter method, digital image method and so on. The weighing method and grid method have higher measurement accuracy, but the leaves need to be picked and weighed, whi...