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Memory working voltage range measuring method

A technology of working voltage range and measurement method, which is applied in the detection of faulty computer hardware, edge calibration, etc., can solve the problems of high production cost of SRAM, achieve the reduction of the number of groups, accurate working voltage range, and reduce the need for measurement the effect of time

Inactive Publication Date: 2011-03-30
INVENTEC CORP
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

However, due to the high production cost of SRAM, it is often used in cache

Method used

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  • Memory working voltage range measuring method
  • Memory working voltage range measuring method
  • Memory working voltage range measuring method

Examples

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Embodiment Construction

[0017] Please refer to figure 1 , which is a flowchart of a method for measuring a working voltage range of a memory according to an embodiment of the present invention. In the method for measuring the working voltage range of the memory, a first critical voltage value of the memory is obtained by successively providing different working voltages to the memory and performing a memory test procedure. When the computer is not working normally, the restart interface is used to trigger the restart of the computer, so as to continue to obtain a second voltage critical value of the memory. Wherein, in order to provide different working voltages to the memory, the working voltage is provided to the memory through a voltage-adjustable jig. The memory operating voltage range measurement method 100 includes:

[0018] In step 110, a memory is plugged into a computer. Wherein, the computer includes a restart interface. The reboot interface can be a baseboard management controller or o...

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Abstract

The invention provides a memory working voltage range measuring method, which comprises the following steps of: inserting a memory into a computer, wherein the computer comprises a restarting interface; ordering a reference voltage as a working voltage supplied to the memory, and making the computer execute a memory test program by using the memory; continuously detecting whether the computer runs normally; when the computer finishes executing the memory test program, recording the working voltage of the memory as a previous voltage; adding an offset to the working voltage; supplying the added working voltage to the memory, and making the computer execute a memory test program by using the memory; and when the computer runs abnormally, judging that the previous voltage is a first voltage critical value of the memory, triggering the computer to restart through the restarting interface, and measuring a second voltage critical value of the memory.

Description

technical field [0001] The invention relates to a voltage range measurement method, and in particular to a memory working voltage range measurement method. Background technique [0002] As long as the computer is turned on, the data or programs in the computer need to be temporarily stored and managed by the memory. So memory can be said to be the best warehouse manager in the computer system. In fact, there is more than one type of memory. According to the function, it can be divided into three types: Read Only Memory (ROM), Flash Memory (Flash Memory), and Random Access Memory (Read Access Memory, RAM). [0003] Among them, the random access memory can also be called the main memory, which can be read and written at any time, and has an extremely fast data transmission speed. Therefore, random access memory is usually used as a temporary data storage medium for operating systems or other programs that are being executed. Random access memory can be divided into static r...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/24
Inventor 孙佑良
Owner INVENTEC CORP
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