Device and method for x-ray examination of an object for material defects by means of x-rays

A material defect, X-ray technology, used in X-ray tube parts, material analysis using radiation, X-ray tubes, etc., can solve problems such as rising, inability to obtain information on objects, and high cost of computed tomography equipment

Inactive Publication Date: 2011-04-20
SIEMENS AG
View PDF10 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] A single two-dimensional projection has the disadvantage that no information about the object can be obtained in terms of the direction of the x-rays, since the parameters measured by the projection are the parameters integrated for the path through the object
Obviously, the already high cost of computed tomography equipment is further increased when special manufacture is provided for certain types of material inspection

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Device and method for x-ray examination of an object for material defects by means of x-rays
  • Device and method for x-ray examination of an object for material defects by means of x-rays
  • Device and method for x-ray examination of an object for material defects by means of x-rays

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0030] figure 1 A section of object 1 to be examined is shown. These are, for example, metal components consumed in vehicles. The assembly is moved in the z-direction, ie in the direction of the drawing plane (for example by means of a conveyor belt not shown) and irradiated there with the test radiation. exist figure 1 In the conventional system shown in , three conventional X-ray sources 2 to 4 are used for the examination of objects. These x-ray sources 2 to 4 generate x-rays 5 , for example fan beams. During the x-ray recording, the x-rays transmitted through the object 1 to be examined are recorded by the detector 6 . That is, projections can be registered by means of which the material properties of the object 1 can be deduced.

[0031] as in figure 1 Conventional X-ray tubes used in X-ray tubes mainly consist of a vacuum chamber with an outer casing, which contains a cathode and an anode. The cathode here works as a negative electrode, which sends electrons to th...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to a device and a method for testing an object (1) for material defects, a multi-emitter x-ray source (8), at least one x-ray detector (6) and a control system (10) to activate emitters (12, 12') of the multi-emitter x-ray source are thereby used. A selective activation of individual emitters (12, 12') or of a portion of the emitters is conducted according to the requirements of at least one item of information related to the tested object (1). The flexible and low-cost material testing is achieved.

Description

technical field [0001] The invention relates to a device and a method for inspecting objects for material defects by means of x-rays. Background technique [0002] In industrial production, so-called X-ray inspection methods are used in the non-destructive raw material and material inspection. Various components are examined here, including, for example, electric motors, robotic components, automotive components, and many others. In non-destructive x-ray testing, the sample or test object is usually placed in a housing shielded from x-rays and irradiated there with x-rays. Inclusions or shrinkage cavities, material defects, internal fractures and fissures etc. which are not visible from the outside can then be analyzed by means of X-rays. [0003] Conventional x-ray recordings of objects provide so-called two-dimensional projections of the object, from which it is possible to draw conclusions about the attenuation or absorption of the x-rays when they penetrate the object....

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/04
CPCH01J2235/068H01J2235/062H01J2235/02H01J35/065H01J35/04G01N23/046G01N2223/419
Inventor 詹斯·富尔斯特马赛厄斯·戈尔达默马库斯·科沃希克于尔根·斯蒂芬
Owner SIEMENS AG
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap