Clamp used for SiC MESFET (Metal Semiconductor Field Effect Transistor) direct current test
A DC test and fixture technology, applied in the direction of single semiconductor device testing, measuring device housing, etc., can solve the problems of device burning, affecting the normal operation of the device DC test, and increasing IDSS, so as to improve the test efficiency and eliminate the device self-excitation phenomenon. Effect
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[0014] In order to make the above objectives, features and advantages of the present invention more obvious and understandable, the technical solutions in the embodiments of the present invention will be described clearly and completely in conjunction with the accompanying drawings and specific implementations in the embodiments of the present invention. Obviously, The described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative work shall fall within the protection scope of the present invention.
[0015] See figure 1 , figure 2 with image 3 It can be seen that the fixture of the present invention includes a PCB board 10 with a filter circuit and a metal plate 11 carrying the PCB board 10; the metal plate 11 is provided with a groove 8 for fixing the SiC MESFET device under test. The PC...
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