Preparation method of silicon-based composite substrate for electronic device
A technology for electronic devices and composite wafers, applied in the field of preparing silicon-based diamond film composite substrates for electronic devices, can solve the problems of chipping of silicon wafers, slow deposition rate, poor quality, etc., and can correct deformation, prevent etching, reduce small deformation effect
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Embodiment 1
[0024] The diamond film is deposited on a silicon substrate with a thickness of 3 inches and a thickness of 4 mm by the plasma jet method. The gas flow rates in the deposition parameters are hydrogen 6L, argon 3L, and methane 90Sccm, and the power parameters are arc current 95A, respectively. The arc voltage is 105V, the deposition temperature is 930°C, the distance between the anode and the silicon substrate is 50mm, the deposition time is 5 hours, and the thickness of the deposited diamond film is 56 microns; then the silicon-based diamond film composite sheet is placed in reverse for arc plasma treatment, The processing parameters are hydrogen 6L, argon 3L, arc current 105A, arc voltage 103V, substrate temperature 950°C, distance between anode and silicon-based diamond composite sheet 50mm, and processing time 10 minutes to obtain silicon-based diamond film composite The thickness of the diamond film in the chip is 56 microns; after taking it out, it is placed in a vacuum he...
Embodiment 2
[0026] The present invention uses the plasma jet method to deposit the diamond film on a silicon substrate with a thickness of 5 inches and 4 millimeters. The gas flow rates in the deposition parameters are respectively 4 L of hydrogen, 6 L of argon, and 120 Sccm of methane, and the parameters of the power supply are arc current respectively. 130A, arc voltage 101V, deposition temperature 1100°C, distance between anode and silicon substrate 60mm, deposition time 6.5 hours, thickness of deposited diamond film 100 microns; take it out and place it in a vacuum heat treatment furnace for annealing to eliminate Residual stress reduces deformation in further processing, vacuum limit is 5×10 -3 Pa, the heating temperature is 1050°C, the holding time is 1.5 hours, the cooling rate is 50°C / hour, and it cools with the furnace when it reaches 700°C. Then the diamond growth surface of the silicon-based diamond film composite sheet is ground and polished. After polishing, the thickness of ...
Embodiment 3
[0028] The present invention uses the plasma jet method to deposit the diamond film on a silicon substrate with a thickness of 2 inches and a thickness of 15 mm. The gas flow rates in the deposition parameters are respectively 7 L of hydrogen, 3 L of argon, and 100 Sccm of methane, and the parameters of the power supply are arc current respectively. 95A, arc voltage 105V, deposition temperature 980°C, distance between anode and silicon substrate 80mm, deposition time 5 hours, thickness of deposited diamond film 65 microns. Then reversely place the silicon-based diamond film composite sheet for arc plasma treatment. The processing parameters are hydrogen 6L, argon 3L, arc current 105A, arc voltage 103V, substrate temperature 950°C, and the anode and silicon-based diamond composite sheet. The distance is 50mm and the processing time is 10 minutes. After taking it out, place it in a vacuum heat treatment furnace for annealing treatment to eliminate residual stress and reduce defo...
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