Open-circuit embedding-removing test structure for trimmer-capacitance MOS (metal oxide semiconductor) varactor and variable capacitance diode
A varactor diode, open circuit de-embedding technology, applied in circuits, electrical components, electrical solid devices, etc., can solve the problem of inability to completely remove parasitic capacitance, and achieve the effect of improving consistency
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[0034] In the following description, a lot of specific details are given in order to provide a more thorough understanding of the present invention. However, it is obvious to those skilled in the art that the present invention can be implemented without one or more of these details. In other examples, in order to avoid confusion with the present invention, some technical features known in the art are not described.
[0035] In order to thoroughly understand the present invention, a detailed structure will be presented in the following description to illustrate how the present invention solves the problem that the open circuit de-embedding test structure of the microcapacitor MOS varactor and varactor diode cannot completely eliminate the parasitic capacitance. Obviously, the implementation of the present invention is not limited to the specific details familiar to those skilled in the semiconductor field. The preferred embodiments of the present invention are described in detail...
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