Grain quality on-line detection apparatus based on field programmable gate array (FPGA), and method thereof

A detection device and food technology, applied in the direction of optical testing flaws/defects, etc., can solve the problems of system processing speed limitation, inability to detect surface color features, etc., and achieve the effect of excellent detection performance

Active Publication Date: 2011-11-23
ZHEJIANG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
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AI Technical Summary

Problems solved by technology

[0010] In the actual online detection, these methods can only detect half of the entire surface of the grain, and cannot complete the detection of the color characteristics of the entire surface; system, w...

Method used

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  • Grain quality on-line detection apparatus based on field programmable gate array (FPGA), and method thereof
  • Grain quality on-line detection apparatus based on field programmable gate array (FPGA), and method thereof

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Experimental program
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Embodiment Construction

[0050] 1. FPGA-based online grain quality detection device:

[0051] As shown in the drawings, the present invention includes a driving drum 1, a speed regulating motor 2, a first driven drum (3), a multi-row seed meter 4, a transparent belt 5, a first line scan camera 6, and a first light box 7. The first line light source 8, the first background plate 9, the U-shaped frame 10, the second background plate 11, the FPGA image processing board 12, the ARM board 13, the second line light source 14, the second line scan camera 15, and the second light source Box 16, second driven roller 17, encoder 18 and third driven roller 19; wherein:

[0052] The bottoms on both sides of the U-shaped frame 11 are respectively equipped with a driving drum 1 and a second driven drum 17 driven by the speed regulating motor 2, and the first driven drum 3 and the second driven drum 17 are respectively installed on the upper parts of the U-shaped frame 10 both sides. The 3rd driven roller 19; The f...

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Abstract

The invention discloses a grain quality on-line detection apparatus based on FPGA, and a method thereof. The apparatus is characterized in that: a multi-line seed metering device is arranged on a left side of a transparent belt; a encoder is arranged on a driven roller, two light boxes are respectively arranged above and below the transparent belt, and are respectively provided with linear light source, a background plate and a line scanning camera, the transparent belt passed between the linear light sources and the background plates; the line scanning cameras are connected with a FPGA imageprocessing plate through CameraLink cables; the power is transmitted to the transparent belt through a speed regulating generator. In the prior art, only the half surface of the grain particle can bedetected during detecting the grain quality through the traditional method. Adoring to the present invention, the disadvantages in the prior art are solved; the amount of the normal grain particles and the amount of the other particles in the sample can be determined rapidly and exactly through detecting the morphological characteristics of the particles and the color characteristics of the wholesurfaces of the particles; the detection performance of the apparatus provided by the present invention is more excellent than the traditional detection apparatus of a machine vision system based on a PC.

Description

technical field [0001] The invention relates to an online grain quality detection device and method, in particular to an FPGA-based grain quality online detection device and method. Background technique [0002] my country is the world's largest grain-producing country, producing more than 500 million tons of grain every year, accounting for 22% of the world's total output. However, what is extremely disproportionate to my country's status as a major grain producer is the relative backwardness of the automation level of my country's grain testing and processing. The general method of domestic grain testing is still at the complete manual stage. Even if some grain quality parameters can be tested by simple instruments and equipment, the accuracy of the results is far from satisfactory. Most grain testing and processing equipment manufacturing enterprises are small in scale, scattered in technology, weak in development capability, single in product, poor in complete set capab...

Claims

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Application Information

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IPC IPC(8): G01N21/89
Inventor 饶秀勤王靖宇应义斌
Owner ZHEJIANG UNIV
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