Method for matching far-and-near offset-distance stacked profile phase frequencies

Abstract

The invention discloses a method for matching far-and-near offset-distance stacked profile phase frequencies, which comprises the steps of: extracting zero-phase wavelets with a same frequency through a mixed-phase wavelet extraction technology, and respectively performing wavelet deconvolution operations by using the extracted zero-phase wavelets with the same frequency and far-and-near offset-distance stacked profiles, so that data phase frequencies of the far-and-near offset-distance stacked profiles are matched; and representing far-and-near offset-distance stacked data x(t) as x(t) = w(t)*(t)+n(t), selecting a zero-phase wavelet with a same frequency under the condition that noises n(t) are omitted, respectively performing wavelet deconvolution by using the wavelet and seismic channels of the far-and-near offset-distance stacked data, to eliminate the differences between frequencies and phases of the far-and-near offset-distance stacked data, so that the wavelet w(t) of a far-and-near offset-distance profile is a zero-phase wavelet w0(t) with the same frequency, and then performing a convolution operation by using the w0(t) and the r(t), so that a matched seismic record is obtained.

Description

technical field [0001] The invention relates to the technical field of petroleum detection, in particular to a method for matching the phase frequency of a stacked profile of far and near offsets. Background technique [0002] In seismic data processing, stacking is an effective denoising method. However, since the motion correction speed is generally the interpolation speed of discrete points during motion correction, it is difficult to extract accurately. As a result, the seismic section after dynamic correction and static correction must have under-correction or over-correction, and there is a certain residual time difference, which makes it impossible to stack in phase, resulting in a decrease in the resolution of the seismic stack section and in high-frequency resolution data processing. The high-frequency loss of the profile is severe. At the same time, due to the dynamic stretching, the event of the far offset profile becomes thicker, and the frequencies of the far ...

AI Technical Summary

Problems solved by technology

However, such processing will often lead to lower resolution in shallow layers and greater energy loss.

Therefore, it is necessary to develop a method that does not require speed extraction while maintaining a high amplitude, so as to solve the problem of inconsistency in the phase and frequency of the stacked data of far and near offsets

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