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Source Multiplexing Test Method

A testing method and testing machine technology, which is applied in the direction of electronic circuit testing, measuring device casing, etc., can solve problems such as time-consuming, low efficiency of testing methods, and failure to maximize the utilization rate of testing machines, so as to improve efficiency and save testing the effect of time

Inactive Publication Date: 2011-12-21
SINO IC TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The test method of the prior art does not maximize the utilization rate of the test machine, especially for the test of large-volume integrated circuit products, the test method of the prior art has low efficiency and takes more time

Method used

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Embodiment Construction

[0017] The following will combine Figure 1 ~ Figure 3 The source multiplexing test method of the present invention is further described in detail.

[0018] In the present invention, each power supply of the testing machine is connected to at least two integrated circuits to be tested by means of relays. By controlling the operation of the relays, the power supply can be simultaneously conducted with the corresponding multiple integrated circuits to be tested, or only one of them can be selected. The integrated circuit under test is turned on;

[0019] In the present invention, in the same test program, the number of integrated circuits to be tested connected to one tester is more than twice the number of power supplies contained in one tester.

[0020] see figure 1 , the source multiplexing testing method of the present invention comprises the following steps:

[0021] Controlling the relay, so that the power supply selects an integrated circuit to be tested from the corre...

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Abstract

The source multiplexing test method of the present invention includes the following steps: controlling the relay, so that the power supply selects an integrated circuit to be tested from at least two corresponding integrated circuits to be tested, and conducts with the selected integrated circuit to be tested; Perform this parameter test on the selected integrated circuit to be tested, and make statistics on the test results; switch the relay, and repeat the above steps until all the parameter items of the integrated circuit to be tested corresponding to the power supply are tested. The source multiplex test method of the invention can improve the utilization rate of the test machine, thereby improving the efficiency of test work and saving test time.

Description

technical field [0001] The invention relates to the field of integrated circuit testing, in particular to a source multiplexing testing method. Background technique [0002] Testing the performance of an integrated circuit includes multiple parameter items, and only when all parameter items meet the standards, the integrated circuit is a qualified product. For the testing of most parameter items, the function of the power supply of the testing machine is to provide the voltage to drive the integrated circuit. Simultaneously provide driving voltage for more than two integrated circuits to be tested, however, for some parameter items (such as the total resistance R of the integrated circuit cc , R cc =V cc / I cc ), the power supply of the testing machine itself is a measured quantity, that is, the power supply of the testing machine not only provides the driving voltage, but also serves as a measured quantity. At this time, one power supply can only be connected to one int...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28G01R1/04
Inventor 江鑫祯顾良波祁建华徐惠
Owner SINO IC TECH