Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method for automatically testing parameters of millimeter wave power amplifier and system

An automatic test system and power amplifier technology, applied in the field of test and measurement, can solve problems such as the inability to test the transmission characteristics of the millimeter wave band

Active Publication Date: 2012-01-18
SHANGHAI INST OF MICROSYSTEM & INFORMATION TECH CHINESE ACAD OF SCI
View PDF4 Cites 42 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

It cannot test the transmission characteristics of the millimeter wave band (such as 26.5GHz to 300GHz), especially the PAE (power added efficiency), 1dB compression point, gain, output power and output spectrum characteristics of the millimeter wave power amplifier

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for automatically testing parameters of millimeter wave power amplifier and system
  • Method for automatically testing parameters of millimeter wave power amplifier and system
  • Method for automatically testing parameters of millimeter wave power amplifier and system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0081] This embodiment provides a parameter automatic test system of a millimeter wave power amplifier, such as figure 1 As shown, it includes: the millimeter wave excitation signal generation unit 1 of the test piece, the millimeter wave excitation signal power control unit 2 of the test piece, the millimeter wave excitation signal detection unit 3 of the test piece, the output signal detection unit 4 of the test piece, the Component DC signal supply unit 5, and test system control unit 6; through millimeter wave spread spectrum technology and GPIB bus technology, the automatic test of power parameters of the test system is realized.

[0082] [DUT millimeter wave excitation signal generation unit 1]

[0083] The millimeter-wave excitation signal generating unit 1 of the DUT includes: a microwave signal source 11 , an active frequency multiplication chain 12 , and an isolator 13 . Since it takes a huge cost to directly generate the excitation signal in the millimeter wave ban...

Embodiment 2

[0110] This embodiment provides a test method for the automatic parameter test system of the millimeter-wave power amplifier described in the first embodiment, the process of which is as follows figure 2 shown. Before testing, it is first necessary to complete the calibration of the dual-channel power meter and power sensor. The calibration steps are as follows:

[0111] (1) Initialize the dual-channel power meter, and set the display unit and display accuracy.

[0112] (2) Select the appropriate power sensor according to the test frequency band of the DUT.

[0113] (3) Connect the power sensor at the input end of the DUT and the power sensor at the output end of the DUT to the channel [A] and channel [B] of the dual-channel power meter respectively.

[0114] (4) In the dual-channel power meter, select the calibration tables corresponding to the power sensors in channel [A] and channel [B].

[0115] (5) Connect the power sensor in channel [A] to the [Ref 50MHz] port of the...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a method for automatically testing parameters of a millimeter wave power amplifier and a system. The system comprises the structure that a millimeter wave excitation signal power control unit of a piece to be tested is connected with a millimeter wave excitation signal power generation unit of the piece to be tested; a millimeter wave excitation signal power detection unit of the piece to be tested is connected with the millimeter wave excitation signal power control unit of the piece to be tested; the input end of the piece to be tested is connected with the millimeter wave excitation signal power detection unit of the piece to be tested; the output end of the piece to be tested is connected with the millimeter wave excitation signal power detection unit of the piece to be tested; a direct current signal supply unit of the piece to be tested is connected with the piece to be tested; and a test system control unit is respectively connected with the millimeter wave excitation signal power generation unit of the piece to be tested, the millimeter wave excitation signal power detection unit of the piece to be tested, the direct current signal supply unit of the piece to be tested and an output signal detection unit of the piece to be tested. According to the method and the system disclosed by the invention, the automatic test of multiple millimeter wave power parameters is realized; the difficulty in lacking of test equipment is overcome; and the defects of manual test efficiency, low accuracy, uncertain factors and the like are avoided.

Description

technical field [0001] The invention belongs to the technical field of testing and measurement, and relates to a testing and measuring system for solid-state electronics, in particular to a parameter automatic testing method and testing system of a millimeter wave power amplifier. Background technique [0002] In recent years, millimeter-wave power amplifiers have been more and more widely used in the fields of test and measurement, communication, detection (guidance, radar, imaging, remote sensing, fuze), etc., and millimeter-wave power amplifiers usually need to test the PAE (power Additional efficiency), 1dB compression point, gain, output power, output spectrum characteristics and other performance indicators, and then analyze the test data. [0003] At present, domestic millimeter-wave automatic test methods are relatively lacking; on the one hand, millimeter-wave test and measurement instruments are expensive, and some of them also involve technical barriers set by for...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01R31/28
Inventor 吴亮孙晓玮秦然李江夏钱蓉佟瑞楼丹沈玮
Owner SHANGHAI INST OF MICROSYSTEM & INFORMATION TECH CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com