Method for measuring object
A technology for measuring objects and measuring values, applied in the direction of measuring devices, 2D image generation, using wave/particle radiation, etc., can solve the problems that are not considered and corrected
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[0175] exist figure 1 Neutral shows by way of example and in principle a CT measuring device which is to be part of a coordinate measuring system in order to measure a workpiece 4 . The device comprises an x-ray source 1 and an x-ray detector 5 with pixels, between which a workpiece or component 4 to be measured is arranged. Here, the x-ray radiation 2 leaving the x-ray source 1 penetrates the component 4 on different paths, wherein scattered radiation or other artifacts can form at the interface of the component 4 (and within the component 4 ), which other artifacts The shadows appear differently depending on the geometry of the radiation length present in the radiation direction.
[0176] In order to effectively correct artifacts that occur during CT measurements, it is now provided that different characteristic curves are used for correcting the measured values of the individual pixels or groups of pixels of the CT detector used (ie x-ray detector 5 ). In this case, var...
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