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Device and method for non-contacting measurement of distance and/or profile

A non-contact, distance technology, applied in the field of distance and/or shape devices, can solve problems such as unreliable measurement, and achieve the effect of reducing shadow effects, less shadows, and evenly scattered distribution

Inactive Publication Date: 2012-02-01
MICRO EPSILON OPTRONIC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, for highly structured measured objects, this will lead to individual shadow areas on the measured object, which means that the measurement of these measured objects may not be reliable
Other systems, such as the sensor described in German patent DE10 2007 050 097 A1, can in fact adapt the sensor to two-dimensional measurement of the measured object by elongating the illumination line, but because of this very large optics are used

Method used

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  • Device and method for non-contacting measurement of distance and/or profile
  • Device and method for non-contacting measurement of distance and/or profile
  • Device and method for non-contacting measurement of distance and/or profile

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Experimental program
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Embodiment Construction

[0034] figure 1 Shown is a side view of the sensing device of the present invention. figure 2 Shown is a top view of the sensing device. figure 2 A cross-sectional view along the optical axis of the first optics and the Fresnel lens is shown. exist figure 1 , the optical axis is drawn in dashed lines and its reference number is 12.

[0035] figure 1 and figure 2 The device 1 shown has a light source 2 which generates a light beam. In this embodiment, the light source 2 is formed by a semiconductor laser. The beam is focused by the collimator 3 and then fanned by the line generating optics 4 . The fanning occurs parallel to the fan plane parallel to the axis 12 of the first optics 13 (consisting of the collimator 3 and the line-generating optics 4 ) and the second optics (Fresnel lens 5 ). exist figure 1 , the fan-shaped plane is perpendicular to the graph; in figure 2 , it coincides with the drawing. The fanned beam is refracted by the Fresnel lens 5 in such a w...

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Abstract

The invention relates to a device (1) for non-contacting measuring of a distance and / or a profile of a measured object (9), a light source (2) generating an illuminating light beam for illuminating the measured object (9), and a detector (11) being provided for detecting the reflected portion of the illuminating light beam at the measured object (9), characterized with regard to a potentially robust and nevertheless compact sensor construction in that a first optic (13) and a second optic are disposed in the beam path of the illuminating light beam, wherein the illuminating light beam can first be expanded in an expansion plane parallel to the diffusion direction by means of the first optic (13), and then made nearly parallel by means of the second optic. In a particularly preferable embodiment, the second optic is formed by a Fresnel lens (5). A corresponding method is disclosed.

Description

technical field [0001] The invention relates to a device for non-contact measuring the distance and / or shape of a measured object, whereby a light source generates an illumination beam to irradiate the measured object, and thereby provides a detector for detecting The reflected portion of the illumination beam. The invention also relates to a related method. Background technique [0002] Devices of this type for non-contact distance and / or shape measurement have been known for a long time in practice. During this process, the light source produces an illumination beam that is prepared by the optics. The illuminating beam is directed at the measured object and irradiates the measured object in the form of points. The portion of the illumination beam that is reflected on the measured object can be detected by the detection device of the sensor, and conclusions can be drawn therefrom about the distance from the sensor to the measured object. [0003] Such sensors usually wo...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G02B5/18G02B27/09G01S17/00G01S17/89
CPCG01S7/481G01S17/89G01S17/48G01S7/4972
Inventor T·奥托P·梅雅T·施塔梅斯特
Owner MICRO EPSILON OPTRONIC