Single event upset-resisting scanning structure D trigger capable of setting and resetting

Abstract

The invention discloses a single event upset-resisting scanning structure D trigger capable of setting and resetting, which aims at improving the single event upset-resisting capability of the single event upset-resisting scanning structure D trigger. The trigger comprises a clock circuit, a scanning control buffer circuit, a resetting buffer circuit, a main latch, a slave latch and an output buffer circuit, wherein the main latch comprises twenty PMOS (P-channel metal oxide semiconductor) tubes and twenty NMOS (N-channel metal oxide semiconductor) tubes, the slave latch comprises ten PMOS tubes and ten NMOS tubes, double-die redundant strengthening is carried out on the main latch and the slave latch respectively, and a C2MOS circuit structure in the main latch is improved, namely upper pulling circuits and lower pulling circuits in the C2MOS circuits which are mutually redundant. The single event upset-resisting scanning structure D trigger has strong single event upset-resisting capability, suitable for a standard unit library of a single event upset-resisting strengthening integrated circuit, and applied to the fields of aviation, spaceflight and the like.

Description

technical field [0001] The invention relates to a master-slave D flip-flop with a settable and resettable structure and a scanning structure, in particular to a settable and resettable scanning structure D flip-flop against single event upset (signal event upset). Background technique [0002] In the universe, there are a large number of high-energy particles (protons, electrons, heavy ions) and charged particles. After the integrated circuit is bombarded by these high-energy particles and charged particles, an electronic pulse will be generated in the integrated circuit, which may cause the original level of the internal node of the integrated circuit to flip. This effect is called single event upset (SEU). The higher the LET (Linear Energy Transfer) value of a single event bombarding an IC, the stronger the resulting electron pulse. Integrated circuits used in aviation and aerospace fields are threatened by single event upsets, which can make integrated circuits work unst...

AI Technical Summary

Problems solved by technology

[0009] The technical problem to be solved by the present invention is to propose a settable and resettable anti-single event flip-flop scanning structure D flip-flop that has low anti-single event flip-flop ability. Structural D flip-flop, which can work well under single-event bombardment with higher LET values ​​without single-event flipping

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