Measuring head simulation system and method of image measurement machine

Abstract

The invention relates to a measuring head simulation method of an image measurement machine, which is operated in a host machine. The method comprises the steps of storing all part names, CAD (computer aided design) model file names corresponding to all parts and position relation among all parts into a measuring head part template file File1, and associating all part names and CAD model files corresponding to all the part names; storing the part names into a measuring head assembling template file according to the drawing sequence, obtaining the corresponding CAD model file from the File1 and drawing a measuring head according to the position relation among all the parts to obtain a three-dimensional figure; defining the rotating angle range, the moving direction and the moving step size of the measuring head; reading moving coordinates of all measuring points and storing the moving coordinates of the measuring points into an array according to the reading sequence; simulating the motion path of the measuring head according to the reading sequence, and drawing and displaying the motion path. The invention also provides a measuring head simulation system of an image measurement machine. By utilizing the invention, the moving simulation to the measuring head can be rapidly realized.

Description

technical field [0001] The invention relates to a measuring head simulation system and method of an image measuring machine. Background technique [0002] Image measurement is currently the most widely used measurement method in the field of precision measurement. This method not only has high precision, but also has fast measurement speed. Image measurement is mainly used to measure the dimensional error and shape error of workpieces (parts or components), and plays an important role in ensuring product quality. [0003] Generally speaking, before the image measuring machine measures the workpiece, it is necessary to simulate the probe of the machine to reduce the problem of touching the needle during the actual measurement process. However, the existing probe simulation has the following defects: (1) it is not intuitive when writing offline programs; (2) the current position of the probe cannot be determined during the program writing process; (3) the position of the meas...

AI Technical Summary

Problems solved by technology

However, the existing probe simulation has the following defects: (1) it is not intuitive when writing offline programs; (2) the current position of the probe cannot be determined during the program writing process; (3) the position of the measuring point cannot be accurately confirmed Whether it is correct; (4) It is impossible to determine the movement path of the probe; (5) It is impossible to determine whether the probe will strike the pin and the position of the striker during the movement of the probe, so as to propose an effective solution; (6) Even if it can be determined that the probe will strike the pin , but the mode of re-selecting the probe will be difficult due to defects such as too many components of the probe, and the mode of changing the program code to draw the probe is more complicated and not easy to expand.

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