Measuring head simulation system and method of image measurement machine

A technology of image measurement and simulation method, which is applied in measurement devices, image data processing, instruments, etc., can solve problems such as unintuitiveness, difficulty in selecting probes, and inability to determine the movement path of probes, so as to reduce drawing and display quickly. and the effect of motion simulation

A technology of image measurement and simulation method, which is applied in measurement devices, image data processing, instruments, etc., can solve problems such as unintuitiveness, difficulty in selecting probes, and inability to determine the movement path of probes, so as to reduce drawing and display quickly. and the effect of motion simulation

CN102445147AInactive Publication Date: 2012-05-09HONG FU JIN PRECISION IND (SHENZHEN) CO LTD +1

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  • Measuring head simulation system and method of image measurement machine
  • Measuring head simulation system and method of image measurement machine
  • Measuring head simulation system and method of image measurement machine

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Embodiment Construction

[0016] Such as figure 1 As shown, it is a schematic diagram of the operating environment of a preferred embodiment of the probe simulation system of the image measuring machine of the present invention. The probe simulation system 10 of an image measuring machine (hereinafter referred to as “system 10 ”) runs on a host 1 , and the host 1 includes a storage device 12 , a processor 14 and a display device 16 .

[0017] In this embodiment, the system 10 is installed in the storage device 12 in the form of software programs or instructions. In other embodiments, the storage device 12 may be an external storage of the host 1 .

[0018] The processor 14 executes the program code of the system 10 to simulate the movement path of the probe, that is, associate the part names of the components of the probe and their corresponding CAD drawings and merge the graphics to reduce the detail of the three-dimensional graphics. Drawing, by reading in the moving coordinates and sequence of the...

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Abstract

The invention relates to a measuring head simulation method of an image measurement machine, which is operated in a host machine. The method comprises the steps of storing all part names, CAD (computer aided design) model file names corresponding to all parts and position relation among all parts into a measuring head part template file File1, and associating all part names and CAD model files corresponding to all the part names; storing the part names into a measuring head assembling template file according to the drawing sequence, obtaining the corresponding CAD model file from the File1 and drawing a measuring head according to the position relation among all the parts to obtain a three-dimensional figure; defining the rotating angle range, the moving direction and the moving step size of the measuring head; reading moving coordinates of all measuring points and storing the moving coordinates of the measuring points into an array according to the reading sequence; simulating the motion path of the measuring head according to the reading sequence, and drawing and displaying the motion path. The invention also provides a measuring head simulation system of an image measurement machine. By utilizing the invention, the moving simulation to the measuring head can be rapidly realized.

Description

technical field [0001] The invention relates to a measuring head simulation system and method of an image measuring machine. Background technique [0002] Image measurement is currently the most widely used measurement method in the field of precision measurement. This method not only has high precision, but also has fast measurement speed. Image measurement is mainly used to measure the dimensional error and shape error of workpieces (parts or components), and plays an important role in ensuring product quality. [0003] Generally speaking, before the image measuring machine measures the workpiece, it is necessary to simulate the probe of the machine to reduce the problem of touching the needle during the actual measurement process. However, the existing probe simulation has the following defects: (1) it is not intuitive when writing offline programs; (2) the current position of the probe cannot be determined during the program writing process; (3) the position of the meas...

Claims

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Application Information

Patent Timeline
09 May 2012
Publication
CN102445147A
IPC
G01B11/00; G06T19/00
CPC
G06T19/00; G01B21/04
Inventors
张旨光; 吴新元