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Light-splitting spectrum type measurement system

A spectroscopic and measurement technology, which is applied in the field of measurement systems, can solve the problems of reducing the reliability of precise detection and affecting the uniformity of detection precision.

Inactive Publication Date: 2012-05-09
致茂电子(苏州)有限公司
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Problems solved by technology

In this way, although the obtained amplified response values ​​31', 33' are the same as the value 32, the error values ​​311, 331 will obviously increase by 3.33 times compared with the error value 321 to form larger error ranges 311', 331', and then It affects the uniformity of detection precision in each wavelength range, and the reliability of precision detection will be greatly reduced.

Method used

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  • Light-splitting spectrum type measurement system
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  • Light-splitting spectrum type measurement system

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Embodiment Construction

[0028] The foregoing and other technical contents, features and effects of the present invention will be clearly presented in the following detailed description of preferred embodiments with accompanying drawings.

[0029] see Figure 4 Shown in the first preferred embodiment of this case, the internal structure of the spectrometer includes a spectroscopic device 4, an array light detection device 5, and a response flattening filter device 6, wherein the spectroscopic device 4 further includes a slit 41, a collimating mirror 42. The light-splitting diffraction element 43 and the focusing mirror 44, and the incident light of different wavelength components incident on the sample to be measured is passed through the slit 41 in the light-splitting device 4 to filter the stray light in space, allowing only narrow range of beam incidence. In this example, a response flattening filter device 6 is set at the light incident position immediately, and the material of the response flatt...

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Abstract

The invention relates to a light-splitting spectrum type measurement system, mainly comprising a light-splitting device, a light detecting device and a filtering device, wherein the light-splitting device is used to decompose light to be measured according to wave length distribution, and the filtering device is used to change light transmittance with different wave length components in advance, so that the penetration rate of the part of the light detecting device, with high spectral response part, is reduced, the penetration rate of the components with low spectral response is maintained to be high, various wave length components measured by the light detecting device are homogenized, errors caused by instrument equipment and environment can not cause unequal interference due to different wave lengths of all components; moreover, the compatibility of the structure and the known technology is high, the manufacturing cost is hardly increased and the accuracy of the spectrum measurement is increased.

Description

【Technical field】 [0001] The invention relates to a measurement system, in particular to a spectrum measurement system which can make the wavelength response uniform to reduce the measurement difference between different wavelength components. 【Background technique】 [0002] With the advancement of science and technology, monitors and other products continue to be introduced, and product performance is continuously improved. Whether it is the white balance of the light source and the display screen, whether the color rendering is good, and the chromaticity distribution of the overall screen, they are all the targets of concern. Therefore, for monitors For a class of commodities, a large number of tests are required at different stages from the light source monomer, module, and finished product, and spectral analysis is an important part of it. Furthermore, since various chemical components have their specific emission and absorption spectra, for various gas emissions or wate...

Claims

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Application Information

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IPC IPC(8): G01J3/28G01J3/18
Inventor 潘鼎翔宋新岳欧聪宪林裕轩简宏达
Owner 致茂电子(苏州)有限公司
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