Device and test method for measuring solar cell characteristic

A solar cell and characteristic technology, which is applied in the direction of single semiconductor device testing, photovoltaic power generation, electrical components, etc., can solve the problems of low precision, slow test speed, expensive equipment, etc., and achieve simple circuit design, easy measurement and use, and convenient methods Effect

Inactive Publication Date: 2012-05-09
NORTHWESTERN POLYTECHNICAL UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The former test operation is cumbersome, the test speed is slow, and the I-V curve of the solar cell cannot be automatically given, and the precision is low; although the latter has high precision and can realize automatic measurement, the equipment is expensive and not realistic enough for laboratory use

Method used

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  • Device and test method for measuring solar cell characteristic
  • Device and test method for measuring solar cell characteristic

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Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0027] Now in conjunction with embodiment, accompanying drawing, the present invention will be further described:

[0028] The purpose of the design of the testing device is to obtain two signals of the output voltage and output current of the solar cell, and to change the output voltage of the solar cell through a variable active load composed of a power supply and a resistance. Since the data acquisition card can only collect voltage signals, the integrated operational amplifier OP07 is used to convert current into voltage. In order to accurately select the adjustable resistance for measurement, the measurement signal is within an appropriate range.

[0029] Solder the electronic components on the circuit board according to the designed test circuit. In order to reduce the cost, first use wires to weld the components on the breadboard, and connect the solar cell to be tested to the circuit.

[0030] attached figure 1 It is the circuit design diagram of Embodiment 1 of the ...

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Abstract

The invention relates to a device and a test method for measuring solar cell characteristic. The device is characterized in that: R1 is connected in series with R2 and then is connected in parallel with Rw and S; grounding is realized between R1 and R2; the positive electrode of a solar cell to be tested is connected with a sliding arm of Rw; the negative electrode of the solar cell to be tested is connected with the negative electrode of an input end of an operational amplifier; the positive electrode of the input end of the operational amplifier is grounded; the resistor Rf is connected in parallel to the negative electrode of the input end of the operational amplifier and an output end of the operational amplifier. The invention provides the device and the test method for measuring the solar cell characteristic. Through constitution of simple electronic elements, a voltage signal and a current signal of the solar cell are tested; the circuit is simple in design; and the method is convenient to implement.

Description

technical field [0001] The invention relates to a device and a test method for measuring solar cell characteristics, which can facilitate rapid and effective measurement in a laboratory, and belong to the field of solar cell test device development. Background technique [0002] Solar cells are a device that directly converts solar energy into electrical energy. However, factors such as the materials selected when making solar cells, the manufacturing process, and the external environment will have a certain impact on the performance of the conversion device, so the performance of the device will directly affect Therefore, accurate measurement of the relevant parameters of the device is the only way to test the device. [0003] According to the working mechanism of the solar cell, the essential characteristics of the solar cell are measured by designing an external circuit. The volt-ampere characteristic is the most important parameter of the solar cell, which directly refle...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/26H02S50/10
CPCY02E10/50
Inventor 郑建邦姜冰一王春锋郝娟
Owner NORTHWESTERN POLYTECHNICAL UNIV
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