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Measurement resource control system and measurement resource control method

A technology for measuring resources and control systems, applied in program control devices, special data processing applications, instruments, etc., can solve problems such as high cost, complicated development and maintenance process, and achieve low cost, convenient matching, and interference elimination

Active Publication Date: 2012-05-23
RIGOL
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0023] In order to solve the problems of complex development and maintenance of application programs and high costs in the prior art, the present invention provides a measurement resource control system that can simplify the development and maintenance of application programs and reduce costs

Method used

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  • Measurement resource control system and measurement resource control method
  • Measurement resource control system and measurement resource control method
  • Measurement resource control system and measurement resource control method

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Experimental program
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no. 1 approach

[0078] Please refer to Figure 7 , the measurement resource control system 4 is applied to a measurement system 2 . The measurement system 2 includes a plurality of measurement resources 20 and a measurement resource control system 4 for managing and controlling the plurality of measurement resources 20 . The plurality of measurement resources 20 includes a plurality of measurement instruments 22 and a plurality of application resources. In this embodiment, the application resources are application programs 24 .

[0079] The measuring instrument 22 is a device with a data acquisition function, and may be a measuring instrument, such as an oscilloscope, a multimeter, a spectrum analyzer, a signal source, a measuring board, or even a sensor. The measurement resource control system 4 is realized by a computer and measurement resource control system software running on the computer. The computer may be a personal computer, a tablet computer, a server or a client connected to the...

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Abstract

The invention discloses a measurement resource control system, which is used for controlling a plurality of measurement instruments and a plurality of application programs. The measurement resource control system comprises an application resource control module, an input module and a resource matching module, wherein the instrument resource control module is used for establishing connection with the measurement instrument and generating an original address and an instrument identifier which correspond to the measurement instrument; the input module is used for receiving an instrument selection instruction for selecting a measurement instrument to be used from the instrument identifier and an application selection instrument for selecting an application program to be used from the application programs from a user; and the resource matching module is used for transmitting an original address corresponding to the measurement instrument to be used to the application program to be used according to the instrument selection instruction and the application selection instruction. The measurement resource control system is relatively simpler in the development and maintenance of the application programs and relatively lower in cost.

Description

technical field [0001] The present invention relates to a measurement resource control system and a measurement resource control method, in particular to a measurement resource control system running on a computer and used to manage multiple measuring instruments and multiple application programs and the measurement resource control method adopted therefor . Background technique [0002] In the fields of industrial engineering and scientific education, measuring and testing instruments are indispensable basic tools in experiments, manufacturing, testing, etc., such as oscilloscopes, multimeters, spectrum analyzers, and signal sources are commonly used general-purpose measuring instruments. With the continuous development of science and technology, measuring instruments are also transformed from analog measuring instruments to digital measuring instruments. Digital measuring instruments have many advantages that analog measuring instruments do not have, such as convenient st...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F9/44G06F17/30
Inventor 王悦王铁军李维森
Owner RIGOL