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Embedded test system

A test system and embedded technology, which is applied in the direction of electronic circuit testing, measuring electronics, measuring devices, etc., can solve the problems of inconvenient placement and movement, low degree of integration, and bulky volume, and achieve saving of test resources and high integration , Ease of use

Inactive Publication Date: 2012-06-13
SUZHOU INDAL PARK HELUO TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

This not only leads to a low degree of integration of the equipment, bulky size, inconvenient placement and movement, but also a waste of test resources and high cost, which is not suitable for testing large-scale electronic products.

Method used

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Embodiment 1

[0012] See figure 1 , an embedded test system, comprising an embedded central processing unit 1, a measurement module 2 connected to the embedded central processing unit 1, a display module 3 connected to the embedded central processing unit 1, connected to the embedded central processing unit 1 storage module 4, a control module 5 connected to the embedded central processing unit 1, a power supply module 6 providing power for the embedded central processing unit 1, a networking processing module 7 connected to the embedded central processing unit 1, and the embedded central processing unit 1 The RS232 data processing module 8 connected to the processor 1. In this embodiment, the Linux operating system is transplanted into the embedded central processing unit, and the relevant measurement equipment is controlled by the relevant system of the embedded central processing unit to complete the test task and integrate various measurement functions into one, which is easy to use and...

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Abstract

The invention discloses an embedded test system, comprising an embedded central processor, a measurement module connected with the embedded central processor, a display module connected with the embedded central processor, a storage module connected with the embedded central processor, a control module connected with the embedded central processor, and a power supply module for providing a power supply for the embedded central processor. The embedded test system provided by the invention has the characteristics of integration of various types of measurement functions, high integration level, small size, freeness from special PC (Personal Computer) controllers and external measurement equipment, and convenience for use; furthermore, in comparison with the conventional measurement equipment, the embedded test system has the advantages of low cost and capabilities of saving test resources and being suitable for testing electronic products on a large scale.

Description

technical field [0001] The invention relates to the field of testing systems, in particular to an embedded testing system for functional testing of electronic products and on-line testing of circuits. Background technique [0002] At present, most of the electronic circuit production and testing equipment are based on PC as the controller, and at the same time, various measuring equipment such as digital multimeter, power supply, counter, waveform generator, etc. are required to form the existing production and testing equipment. This not only leads to a low degree of integration of the equipment, but also bulky, inconvenient placement and movement, and waste of testing resources and high cost, making it unsuitable for testing large-scale electronic products. [0003] In recent years, with the continuous development of embedded technology, the development of embedded systems has become increasingly mature, making it possible to use low-cost and high-efficiency embedded syste...

Claims

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Application Information

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IPC IPC(8): G01R31/00G01R31/28
Inventor 诸荩锋
Owner SUZHOU INDAL PARK HELUO TECH
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