Embedded test system

A test system and embedded technology, which is applied in the direction of electronic circuit testing, measuring electronics, measuring devices, etc., can solve the problems of inconvenient placement and movement, low degree of integration, and bulky volume, and achieve saving of test resources and high integration , Ease of use
CN102495314AInactive Publication Date: 2012-06-13SUZHOU INDAL PARK HELUO TECH
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Patent Information

Authority / Receiving Office
CN Β· China
Current Assignee / Owner
SUZHOU INDAL PARK HELUO TECH
Publication Date
2012-06-13
Estimated Expiration
Not applicable Β· inactive patent

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Abstract

The invention discloses an embedded test system, comprising an embedded central processor, a measurement module connected with the embedded central processor, a display module connected with the embedded central processor, a storage module connected with the embedded central processor, a control module connected with the embedded central processor, and a power supply module for providing a power supply for the embedded central processor. The embedded test system provided by the invention has the characteristics of integration of various types of measurement functions, high integration level, small size, freeness from special PC (Personal Computer) controllers and external measurement equipment, and convenience for use; furthermore, in comparison with the conventional measurement equipment, the embedded test system has the advantages of low cost and capabilities of saving test resources and being suitable for testing electronic products on a large scale.
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Description

technical field

[0001] The invention relates to the field of testing systems, in particular to an embedded testing system for functional testing of electronic products and on-line testing of circuits. Background technique

[0002] At present, most of the electronic circuit production and testing equipment are based on PC as the controller, and at the same time, various measuring equipment such as digital multimeter, power supply, counter, waveform generator, etc. are required to form the existing production and testing equipment. This not only leads to a low degree of integration of the equipment, but also bulky, inconvenient placement and movement, and waste of testing resources and high cost, making it unsuitable for testing large-scale electronic products.

[0003] In recent years, with the continuous development of embedded technology, the development of embedded systems has become increasingly mature, making it possible to use low-cost and high-efficiency embedded syste...

Claims

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