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Femtosecond X-ray pulse measurement method and application thereof

A technology of ray pulse and measurement method, which is applied in the field of femtosecond X-ray pulse measurement, and can solve the problem that the photoelectron energy spectrum is not readily available.

Inactive Publication Date: 2013-04-10
PEKING UNIV
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  • Description
  • Claims
  • Application Information

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Problems solved by technology

The time width of femtosecond X-ray pulses spans many periods of ordinary laser pulses, and there is no ready-made method for deciphering photoelectron spectroscopy

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  • Femtosecond X-ray pulse measurement method and application thereof
  • Femtosecond X-ray pulse measurement method and application thereof
  • Femtosecond X-ray pulse measurement method and application thereof

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Embodiment Construction

[0041] The present invention will be further elaborated below through specific embodiments in conjunction with the accompanying drawings.

[0042] Light as an electromagnetic wave is expressed as: The waveform of the light pulse is determined by the time parameter t (or phase ) and intensity f(t) physical quantities, so the pulse waveform can be reconstructed by obtaining the physical parameters of time and intensity.

[0043] figure 1 is a schematic diagram of the experimental setup for measuring femtosecond X-ray pulses. The source of femtosecond X-ray pulses includes high-order harmonic radiation generated by atoms in a strong laser electric field, Thomson scattering and Compton scattering X-rays generated by high-energy electrons colliding with femtosecond laser pulses, and free electron lasers. Femtosecond X-rays from synchrotron radiation, femtosecond X-rays from pulsed high-energy electron beam bremsstrahlung, femtosecond X-rays from plasmas, and femtosecond X-rays...

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Abstract

The invention discloses a femtosecond X-ray pulse measurement method and application thereof. The femtosecond X-ray pulse measurement method includes: determining time parameters corresponding to the measured photoelectron energy according to parameterized calculation formulas and photoelectron speed spectrum; and reconstructing the shape of femtosecond X-ray pulse and specific time structure at one step by the aid of analytical differential equations of the photoelectron spectrum and the relative spectrum unscrambling technology. Without a great quantity of time-resolved measurement for the photoelectron spectrum or tedious iterative computation and test data fitting process, the measurement method can reconstruct time-domain characteristics of the femtosecond X-ray pulse from each measured photoelectron spectrum. In addition, the measurement method can be used for researching, analyzing, evaluating and optimizing technical parameters and performance indexes of a femtosecond X-ray pulse light source, and can also be used for researching relative information changing along with time in the quick reaction kinetics.

Description

technical field [0001] The invention belongs to ultrafast optics, in particular to a method for measuring femtosecond X-ray pulses and its application. Background technique [0002] Femtoseconds with ever-shorter time widths (10 -15 seconds) X-rays as excitation and detection light pulses. Generating and measuring femtosecond X-ray pulses has always been a frontier topic in the field of ultrafast measurements. However, generating and measuring the temporal structure of femtosecond X-rays has been technically challenging. For picoseconds (10 -12 Seconds) time-width X-ray pulses can be measured with well-established streak camera technology and conventional fast electronics; for these shorter pulses of light, the available interactions are generally lacking or not understood, especially nonlinear optics process. So far, several methods and techniques for generating and measuring femtosecond X-rays have been proposed. Bucksbaum and Lindenberg et al earlier tried to genera...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J11/00G01N23/22
Inventor 葛愉成
Owner PEKING UNIV