Method for detecting appearance of capacitance product and detector implementing method

Abstract

The invention discloses a method for detecting an appearance of a capacitance product, and also discloses a detector implementing the method. The detector comprises a rack, a feed delivery device, a take out device, a rotary table mechanism arm, a first detecting device, a first rejection area, a belt conveying device, a second detecting device, a push-off device, a second rejection area, a final qualified area and an industrial personal computer. The method provided by the invention can be used for quickly and accurately complete detection of the appearance of the capacitance product. The detector provided by the invention has a compact structure and high automaticity, a working condition of each component device is correspondingly controlled through the industrial personal computer so as to realize automatic detection of the appearance of the capacitance product, and the detector has high detection accuracy and fast speed; the labor intensity is reduced, the production efficiency is greatly improved simultaneously, the quality of products is ensured, the qualified rate of the products is improved, and the competitiveness of enterprises is enhanced.

Description

technical field [0001] The invention relates to the technical field of appearance detection, in particular to a method for detecting the appearance of capacitor products and a detection machine for implementing the method. Background technique [0002] In the Pearl River Delta region, more than 90% of the world's computer industry giants gather, and there are nearly 3,000 electronic information companies. A golden corridor for the electronic information industry has been formed along the Pearl River Delta. The production of semi-finished products such as computer magnetic heads accounts for about 40% of the global market; the production of circuit boards and computer drives accounts for 30% of the global market. At present, most of the surface quality inspections of domestic large-scale microcapacitor devices are observed and judged by human eyes under high-power microscopes. Some product defect inspections have strict optical requirements, and it is difficult to judge with ...

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Problems solved by technology

This product defect detection method has many deficiencies. First, the human eye works under a high-magnification microscope for a long time, which is very prone to fatigue, misjudgment and missed judgment; secondly, due to everyone's awareness and understanding of the standard Different, the standard of subjective judgment is not the same, it is difficult to quantify, so in the detection process, there is no uniform detection standard; finally, due to the heavy workload and high repeatability of detecti

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