Test system of power down protection function of smart card and method

Abstract

The invention provides a test system of a power down protection function of a smart card and a method. The system comprises a card reader, a smart card, a megahertz-level high-speed electronic switch and a control device, wherein the card reader and the smart card are used for carrying out data communication; the high-speed electronic switch is connected between the card reader and the smart card and is connected with the control device, and the high-speed electronic switch is controlled by the control device to connect or disconnect the card reader and the smart card; the control device is connected with the card reader; when the high-speed electronic switch is controlled to be connected, the data communication of the card reader and the smart card is tracked; and when the high-speed electronic switch is controlled to be disconnected, the data protection condition of the smart card is tested. The system can accurately simulate the power down process of the smart card in any time, and therefore the data protection function of the smart card in the sudden power down condition is effectively tested. The hardware structure is simple and small and convenient for carrying, and has low cost.

Description

technical field [0001] The invention relates to a smart card performance test technology, in particular to a test system and method for the power-down protection function of a smart card. Background technique [0002] Smart card is also called IC card (Integrated Circuit Card / SMART card). According to the different integrated circuits used in the card, it can be divided into memory card, logic encryption card, CPU card and radio frequency card. Since the CPU card integrates a microprocessor, a storage unit and a chip operating system COS (Chip Operating System), a complete computer system is formed. [0003] With the development of my country's informatization, smart cards are more and more widely used in industries such as finance, transportation, e-commerce, e-government, communications, medical insurance, and social insurance to realize functions such as network payment, identity verification, confidential storage, and communication. . The power-down protection function...

AI Technical Summary

Problems solved by technology

[0005] (1) The power-down process of the smart card at any moment cannot be accurately simulated, so the data protection situation under the sudden power-down situation of the smart card cannot be effectively tested;

[0006] (2) The simulated power-down process may cause jitter and cause other problems, so that the correct test of the power-down protection function of the smart card cannot be guaranteed;

[0007] (3) There is great randomness in the power-off operation using manual or relays. In order to cover the test points as much as possible, tens of thousands of operations must be performed, which will result in a long time period for completing the test and high labor costs.

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