Off-line and on-line test integrated multi-wavelength optical path component

Abstract

The invention provides an off-line and on-line test integrated multi-wavelength optical path component, which is characterized in that optical detection signals of off-line test wavelength or on-line test wavelength are coupled to an input end A of a 2x2 optical directional coupler through 3x1 WDM (wavelength division multiplex), a branch C and a branch D of the directional coupler are respectively connected with In1 end of a 1x2 optical switch and one end of a band-pass filter of 1625nm (or 1650nm) wave band, the band-pass filter can only allow optical signals with awavelength ranging from 1600nm to 1670nm to pass, the other end of the band-pass filter is connected with a In2 end of the 1x2 optical switch, and an output end of the optical switch is connected with an optical fiber output port of an instrument.

Description

technical field [0001] The invention relates to the field of optical fiber communication, in particular to a multi-wavelength optical path assembly integrating off-line and on-line testing. Background technique [0002] In the optical fiber communication system, the optical time domain reflectometer (OTDR) is an indispensable test instrument in the construction, maintenance and repair of optical fiber and cable lines of the optical fiber communication system. In optical time domain reflectometers, usually such as figure 1 The optical path shown injects the probe signal from the laser source into the fiber under test. Among them, the 1310nm band and the 1550nm band are the laser light sources required for the test, and the WDM is a wavelength division multiplexer. The laser light source is injected into the optical fiber under test through the WDM and the optical directional coupler, and the optical signal returned from the optical fiber passes through the optical directiona...

AI Technical Summary

Problems solved by technology

[0003] However, with the rise of FTTx network construction and the rapid development of PON networks, it is required that the optical time domain reflectometer not only has offline test wavelengths (such as 1310nm band and 1550nm band), but also has the online test capability of 1625nm band or 1650nm band , that is, the optical fiber under test can start the online test function of the optical time domain reflectometer under the condition of communication light. At this time, the traditional optical path can no longer meet the new test requirements. For online testing, a filter must be connected to the optical path to filter out all the non-1625nm or non-1650nm optical signals returned from the optical fiber (such as the 1310nm or 1550nm optical signals emitted by the optical transceiver) to avoid damage to the optical time domain. The test of the reflectometer causes interference, but the optical path connected to the filter cannot realize the off-line test function of the 1310nm band and the 1550nm band. The usual solution is to use two sets of independent optical paths and circuits (such as figure 2 shown), but this method will result in a substantial increase in instrument cost

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