Infrared broadband transmission type plastic film thickness measuring device and infrared broadband transmission type plastic film thickness measuring method

A plastic film and thickness measurement technology, which is applied in the direction of measuring devices, optical devices, instruments, etc., can solve the problems of poor accuracy and poor versatility, and achieve the effect of improving versatility and accuracy

Inactive Publication Date: 2012-07-04
HARBIN INST OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0009] In order to solve the problems of poor accuracy and poor versatility in the existing infrared transmission thickness measurement met

Method used

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  • Infrared broadband transmission type plastic film thickness measuring device and infrared broadband transmission type plastic film thickness measuring method
  • Infrared broadband transmission type plastic film thickness measuring device and infrared broadband transmission type plastic film thickness measuring method
  • Infrared broadband transmission type plastic film thickness measuring device and infrared broadband transmission type plastic film thickness measuring method

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specific Embodiment approach 1

[0021] Specific implementation mode one: the following combination figure 1 Illustrate this embodiment, the infrared wide-band transmissive plastic film thickness measurement device described in this embodiment, it includes a broadband infrared light source 1, it also includes a thermopile detector 2, a signal processing unit 3 and an industrial computer 4,

[0022] The outgoing light of the broadband infrared light source 1 is incident on the plastic film to be tested, and is received by the thermopile detector 2 after being transmitted through the plastic film to be tested, and the electrical signal output end of the thermopile detector 2 is connected to the electrical signal input end of the signal processing unit 3 , the digital signal of the signal processing unit 3 is transmitted to the industrial computer 4 through the serial communication interface.

[0023] In this embodiment, a reflective cup can also be provided. The reflective cup is placed at the rear of the broa...

specific Embodiment approach 2

[0024] Specific implementation mode two: the following combination figure 1 Describe this embodiment. This embodiment is a method for measuring the thickness of a plastic film based on the infrared wide-band transmission type plastic film thickness measuring device described in Embodiment 1. The outgoing light of the broadband infrared light source 1 is absorbed and scattered by the measured plastic film. Afterwards, it is received by the thermopile detector 2, and the thermopile detector 2 converts the received optical signal into an electrical signal and outputs it to the signal processing unit 3, and the signal processing unit 3 calculates and obtains the optical power information according to the received electrical signal and passes The serial communication interface transmits to the industrial computer 4, and the industrial computer 4 obtains the thickness value of the measured plastic film through calculation.

specific Embodiment approach 3

[0025] Specific embodiment three: this embodiment is a further description of embodiment two. The specific method for obtaining the thickness value of the measured plastic film by the industrial computer 4 described in this embodiment is as follows:

[0026] According to the formula: P=KP 0 exp(-αL),

[0027] In the formula, P is the optical power of the transmitted light output by the signal processing unit 3, K is the calibration coefficient, and P 0 is the outgoing light power of the broadband infrared light source 1, α is the extinction coefficient of the measured plastic film, L is the thickness of the measured plastic film,

[0028] Solve to obtain the thickness L of the measured plastic film.

[0029] In this embodiment, the calibration coefficient K and the extinction coefficient α of the measured plastic film can be obtained by measuring two known thicknesses L 1 and L 2 The standard thin film is obtained, which can be solved by the following two-variable equation...

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Abstract

An infrared broadband transmission type plastic film thickness measuring device and an infrared broadband transmission type plastic film thickness measuring method belong to the technical field of infrared transmission measurement of plastic film thickness and solve the problems that the existing infrared transmission thickness measuring methods are poor in accuracy and universality. The measuring device comprises a broadband infrared source, a thermopile detector, a signal processing unit and an industrial personal computer. The measuring method includes: emergent light from the broadband infrared source is absorbed by a measured plastic film and scattered and attenuated prior to being received by the thermopile detector, received optical signals are converted into electrical signals by the thermopile detector, the electrical signals are then outputted to the signal processing unit, the signal processing unit calculates to obtain optical power information according to the received electrical signals, the optical power information is transmitted to the industrial personal computer through a serial communication port, and the industrial personal computer calculates to obtain the thickness value of the measured plastic film. The infrared broadband transmission type plastic film thickness measuring device and the infrared broadband transmission type plastic film thickness measuring method are applicable to measurement of thickness of plastic films.

Description

technical field [0001] The invention relates to an infrared wide-band transmission type plastic film thickness measuring device and a measuring method, belonging to the technical field of infrared transmission measurement of plastic film thickness. Background technique [0002] At present, the more advanced online measurement method of plastic film thickness is to use infrared transmission method to measure film thickness. This measurement method overcomes the shortcomings of radiation pollution and high cost in the previous ray attenuation measurement methods, and at the same time overcomes the shortcomings of other traditional methods such as low measurement accuracy, slow response speed and susceptibility to environmental influences. [0003] The principle of infrared transmission method to measure film thickness is Lambert's law, its output light intensity I, input light intensity I 0 The relationship with the film thickness L is: [0004] I=I 0 exp(-αL), [0005] wh...

Claims

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Application Information

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IPC IPC(8): G01B11/06
Inventor 孙晓刚邱超
Owner HARBIN INST OF TECH
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