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Detection device for defective products of solar cells

A technology of solar cells and detection devices, which is applied in non-contact testing, single semiconductor device testing, etc., can solve problems such as fill factor reduction, P-N junction damage, battery parallel resistance reduction, etc., to reduce incidence and cost Effect

Inactive Publication Date: 2012-07-04
浙江旭辉光电科技股份有限公司
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Problems solved by technology

[0002] The reverse current of the solar cell refers to the leakage current of the P-N junction of the battery, which reflects the quality of the P-N junction. The increase of the leakage current will reduce the parallel resistance of the battery, thereby reducing the fill factor and resulting in a decrease in the effective power of the battery.
There are many factors that cause damage to the P-N junction by the current production process of the manufacturer. The incidence of reverse current defective products (reverse current value 1.0~2.5A) has always been above 5%, and the burn-through product (reverse current value exceeds 2.5A) A) The incidence rate is more than 1.5%

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  • Detection device for defective products of solar cells
  • Detection device for defective products of solar cells
  • Detection device for defective products of solar cells

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Embodiment Construction

[0022] The present invention will be further described in detail below in conjunction with the drawings and specific embodiments.

[0023] The detection principle of defective solar cells: The solar cell 1 includes an N zone 11 and a P zone 12. The interface between the N zone 11 and the P zone 12 forms a space charge zone called a PN junction 13. In the absence of light, apply a reverse voltage to the PN junction 13 (the N area 11 is connected to positive, and the P area 12 is connected to negative). At this time, a reverse current will be generated, and most of the reverse current is from the damage point of the PN junction 13 When the current flows through it, heat will be generated, so that the temperature at the point where the PN junction 13 is damaged will increase.

[0024] Use the infrared imager 5 to detect the heat generated by the temperature, and the color of the image displayed on the screen and the hot spot tracking display function can determine the heat...

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Abstract

The invention relates to a detection device for defective products of solar cells, and discloses an infrared imaging detection device for defective products of solar cells. The infrared imaging detection device comprises a computer (2), a CV / CC power supply (3) and an infrared imaging device (5), wherein the CV / CC power supply (3) is connected with the infrared imaging device (5), the infrared imaging device (5) is connected with the computer (2), the CV / CC power supply (3) applies a reverse current, defective products are reflected by temperature fluctuation on the surface of the battery under the action of an external electric field through infrared imaging and are subjected to infrared capturing as well as output through the computer for being analyzed, thus the defective products of the solar cells are detected. According to the technical scheme of the invention, reverse electricity leakage points on the solar cells can be detected and countermeasure is obtained through analysis so that the occurring rate of defective reverse current is improved and finally reduced, thus cost is reduced; and by combining infrared imaging with reverse current measurement, electricity leakage condition of the solar cells is completely detected.

Description

Technical field [0001] The invention relates to a detection device for defective solar cells, in particular to an infrared imaging detection device for defective solar cells. Background technique [0002] The reverse current of the solar cell refers to the leakage current of the battery P-N junction, which reflects the quality of the P-N junction. The increase of the leakage current will reduce the parallel resistance of the battery, thereby reducing the fill factor and leading to the reduction of the effective power of the battery. There are many factors that cause damage to the PN junction by the current manufacturer’s usability process. The occurrence rate of defective reverse current products (reverse current value 1.0~2.5A) has been above 5%, and burn-through products (reverse current value exceeding 2.5 A) The incidence is more than 1.5%. Summary of the invention [0003] In view of the shortcomings in the prior art, the present invention provides a solar cell defective...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/265
Inventor 吴奕德邵林伟陈令尚
Owner 浙江旭辉光电科技股份有限公司
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