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Electric performance test system based on NI (national instruments) data acquisition equipment for multi-pin connectors

A technology of data acquisition equipment and electrical performance, applied in the direction of instruments, measuring electronics, measuring devices, etc., can solve the problems of long test time, test test, poor efficiency, etc., and achieve low cost, fast, convenient, accurate, and fast results

Inactive Publication Date: 2012-08-01
科纳技术(苏州)有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Therefore, the traditional test equipment cannot test it, but the operator directly uses the multimeter to test one by one. The test time is long, the efficiency is poor, and it will also cause mismeasurement due to operator errors.

Method used

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  • Electric performance test system based on NI (national instruments) data acquisition equipment for multi-pin connectors
  • Electric performance test system based on NI (national instruments) data acquisition equipment for multi-pin connectors
  • Electric performance test system based on NI (national instruments) data acquisition equipment for multi-pin connectors

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Embodiment Construction

[0017] In order to quickly, conveniently and accurately test the electrical performance of the multi-pin connector, the present invention proposes a testing system for the electrical performance of the multi-pin connector based on NI data acquisition equipment. The test system is simple and convenient to operate, has strong flexibility, can configure the number of test pins arbitrarily, and has strong versatility. It can arbitrarily configure the short-circuit condition between multiple pins, and has low requirements for the use environment and wide application. It can be used in fields that require test connectors. Therefore, it is suitable for large enterprises to test the electrical performance of batch multi-pin connectors. The electrical performance testing system includes a computer 1; an NI data acquisition card 2; a USB data cable 3; a cable 4; and a multi-pin connector 5 to be tested. The specific implementation of the multi-pin connector electrical performance testin...

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Abstract

The invention relates to an electric performance test system for multi-pin connectors, in particular to an electric performance test system based on NI (national instruments) data acquisition equipment for multi-pin connectors. By the aid of the electric performance test system, electric performances of a multi-pin connector can be quickly, conveniently and accurately tested, the electric performance test system is simple and convenient in operation and high in flexibility and versatility, an optional quantity of test pins can be configured, short and open circuit conditions among the multiple pins can be optionally configured, requirements on service environments of the system are low, and the electric performance test system can be widely applied to fields needing to test connectors, and is particularly suitable for testing electric performances of multi-pin connectors in a batch for a large-size enterprise.

Description

technical field [0001] The invention relates to an electrical performance testing system of a multi-pin connector, in particular to an electrical performance testing system of a multi-pin connector based on NI data acquisition equipment. The invention is widely applicable to various fields requiring detection of electrical properties of multi-pin connectors, especially suitable for large-scale enterprises to test the electrical properties of multi-pin connectors in batches, and has simple and convenient operation, strong flexibility and versatility. Background technique [0002] At present, the electrical performance requirements of connectors that communicate with the outside world in communication, medical, and testing equipment are getting higher and higher, and more and more equipment needs to test the short-circuit condition between multiple pins of the connector. [0003] However, at present, there are mainly open circuit and short circuit tests for multi-pin connector...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00
Inventor 阚仁根陈志超刘宏欣刘华袁海骥
Owner 科纳技术(苏州)有限公司