Shift register unit, shift register circuit, array substrate and display device

Abstract

The invention provides a shift register unit, a shift register circuit, an array substrate and a display device and relates to the field of manufacturing of displays. Through the invention, the threshold value voltage drift of a grid electrode of a grid line driver transistor can be reduced, and the work stability of the device is improved. The shift register unit comprises a first transistor, a pull-up closing unit, a pull-up opening unit, a first pull-up unit, a second pull-up unit, a trigger unit and an output unit. The shift register unit, the shift register circuit, the array substrate and the display device are used for the manufacturing of the displays.

Description

technical field [0001] The invention relates to the field of liquid crystal display manufacture, in particular to a shift register unit, a shift register circuit, an array substrate and a display device. Background technique [0002] In recent years, the development of displays has shown a trend of high integration and low cost. One of the very important technologies is the mass production of GOA (Gate Driver on Array, array substrate row drive). Using GOA technology to integrate TFT (Thin Film Transistor, Thin Film Field Effect Transistor) gate switch circuit on the array substrate of the display panel to form a scan drive for the display panel, so that the gate drive integrated circuit part can be saved, which can not only The product cost is reduced in terms of material cost and manufacturing process, and the display panel can achieve a beautiful design with symmetrical sides and narrow borders. At the same time, since the Bonding process in the Gate direction can be om...

AI Technical Summary

Problems solved by technology

[0003] Since the shift register circuit is directly made on the substrate through the backplane process, the instability in the backplane manufacturing process, especially in the LTPS (Low Temperature Poly-silicon, low temperature polysilicon technology) process, will cause the backplane The difference in TFT characteristics between TFT devices, especially the gate threshold voltage Vth of the TFT device will drift, which will lead to the failure of the shift register circuit

In addition, in the display reliability test of display products, due to long-term exposure to high-temperature and high-humidity environments, TFT characteristics will also change, resulting in Vth drift of TFT devices during shift register circuits.

Therefore, the shift register circuit provided by the prior art has the phenomenon that the Vth threshold voltage of the output TFT gate drifts, thereby affecting the stability of the output characteristics of the output terminal of the circuit.

Images