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Process for production of contact structure for organic semiconductor device, and contact structure for organic semiconductor device

A technology of organic semiconductors and organic semiconductor layers, applied in semiconductor/solid-state device manufacturing, semiconductor devices, electric solid-state devices, etc., can solve the problems of organic semiconductor layer damage, poor reproducibility, and inability to reduce contact resistance, etc., to achieve the goal of reducing contact resistance Effect

Inactive Publication Date: 2015-06-24
NAT INST FOR MATERIALS SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0012] Various attempts have been made to reduce contact resistance in conventional organic semiconductor devices, but there are problems such as poor reproducibility and damage to the organic semiconductor layer due to sputtering of oxides, making it impossible to reduce contact resistance

Method used

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  • Process for production of contact structure for organic semiconductor device, and contact structure for organic semiconductor device
  • Process for production of contact structure for organic semiconductor device, and contact structure for organic semiconductor device
  • Process for production of contact structure for organic semiconductor device, and contact structure for organic semiconductor device

Examples

Experimental program
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Effect test

Embodiment 1

[0079] As Example 1, a figure 1 The organic transistor 10 is shown. Electrode 6 has a two-layer structure including charge injection layer 4 and current supply layer 5 . Specifically, a substrate in which a silicon oxide film 2 of 200 nm was formed on the surface of a highly doped silicon wafer 1 was used as the substrate. Here, highly doped silicon wafer 1 functions as a gate electrode, and silicon oxide film 2 functions as a gate insulating layer. After modifying the surface of the silicon oxide film 2 with phenylethyl trichlorosilane (Phenethyl trichlorosilane), pentacene as the organic semiconductor layer 3 was vacuum-deposited with a film thickness of 40nm, and formed thereon. Layer-structured electrodes 6 . The electrode 6 is constituted by evaporating 2 nm of Cu as the charge injection layer 4 on the organic semiconductor layer 3 and 38 nm of gold (Au) as the current supply layer 5 thereon. One of these two electrodes 6 is used as a source electrode S, and the othe...

Embodiment 2

[0092] In Example 2, the organic transistor 10 was fabricated in the same manner as in Example 1 except that the charge injection layer 4 was formed using Cu, Fe, Co, Be, Ni, Zn, Al, and Cr.

Embodiment 3

[0101] As Example 3, an organic transistor 10 having a structure having two-layer electrodes 6 having the same structure as Example 1 except for having Cu and Al as charge injection layers 4 was fabricated. The fabrication of the organic transistor 10 is all carried out in a vacuum evaporation device and a glove box inside which maintains an inert gas atmosphere, so that the organic transistor 10 is not exposed to the atmosphere once during the whole process of device fabrication. That is, the treatment has been performed in an atmosphere in which no oxygen exists. Thereafter, after taking out the completed organic transistor 10 having a contact structure and leaving it under the atmosphere for 4 hours, electrical characteristics were measured.

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Abstract

A method of manufacturing a contact structure for organic semiconductor devices having excellent electrical characteristics and a contact structure of organic semiconductor devices are provided. To manufacture a contact on an organic semiconductor layer 3, a very thin film of several nm or thinner, for example, of an easily oxidizable metal is formed first, and this film is used as a charge-injection layer 4. On the charge-injection layer 4, a current-supply layer 5 is then formed using a conductive material such as a stable metal. The contact resistance for organic semiconductor devices can be decreased by simple processes and by using inexpensive materials.

Description

technical field [0001] The present invention relates to a method for fabricating a contact structure of an organic semiconductor device and a contact structure of an organic semiconductor device that can reduce the contact resistance between an organic semiconductor layer and an electrode in an organic semiconductor device such as an organic semiconductor transistor. Background technique [0002] It is known that organic semiconductor devices such as organic transistors, organic light-emitting diodes, organic solar cells, and organic memories have very large contact resistance compared with inorganic semiconductor devices, which gradually becomes an obstacle to device operation. As contact materials of organic semiconductor devices, stable noble metals such as gold and conductive metal oxides are generally used. This is considered to be because noble metals are stable in the atmosphere, and gold and platinum have large work functions, so holes are easily injected into p-type...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/28H01L21/336H01L27/28H01L29/786H01L33/02H01L51/05H01L51/42H01L51/50
CPCH10K10/466H10K10/84
Inventor 三成刚生熊谷明哉塚越一仁
Owner NAT INST FOR MATERIALS SCI