Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Material electromagnetic parameter measuring system

A technology for measuring systems and electromagnetic parameters, applied in the field of measuring systems, can solve the problems of high cost of lens antennas, affecting test accuracy, increasing the difficulty of calibration operation, etc., and achieves the effects of good wave absorption performance, thin thickness and wide wave absorption frequency band.

Inactive Publication Date: 2012-10-10
KUANG CHI INST OF ADVANCED TECH
View PDF4 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the lens antenna is expensive, and the test sample must be precisely placed at the geometric center of the transceiver lens, which affects the test accuracy and increases the difficulty of calibration operations

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Material electromagnetic parameter measuring system
  • Material electromagnetic parameter measuring system
  • Material electromagnetic parameter measuring system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0021] Please refer to figure 2 , figure 2 It is a structural schematic diagram of the material electromagnetic parameter measurement system of the present invention. figure 2 Among them, the material electromagnetic parameter measurement system of the present invention includes a transmitting antenna 10 , a receiving antenna 20 and a sample holder 30 located between the transmitting antenna 10 and the receiving antenna 20 . The sample to be tested 40 is arranged on the sample holder 30 , except for the surface occupied by the sample to be tested 40 , other surfaces of the sample holder 30 are covered by the wave-absorbing material 50 .

[0022] Further, the receiving antenna 20 and the transmitting antenna 10 are arranged coaxially, and the length of the sample 40 to be tested is approximately equal to the diameter of the transmitting antenna 10 and the receiving antenna 20 . When the length of the tested sample 40 is greater than the diameter of the antenna aperture sur...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a material electromagnetic parameter measuring system which comprises a transmitting antenna, a receiving antenna and a sample bracket positioned between the transmitting antenna and the receiving antenna. A measured sample is arranged on the sample bracket; and besides the surface on the sample bracket, which is occupied by the measured sample, other surfaces on the sample bracket are covered by wave-absorbing materials. According to the invention, the sample is clamped by the sampled sample bracket and the wave-absorbing materials are arranged at both sides of the sample bracket, so that the material electromagnetic parameter measuring system disclosed by the invention can obtain material electromagnetic parameters without adopting an expensive lens antenna. Furthermore, the wave-absorbing materials in the material electromagnetic parameter measuring system disclosed by the invention can be selected from commercially common wave-absorbing materials such as wave-absorbing sponges and the like; the wave-absorbing materials can also be designed by utilizing a metamaterial principle; and the wave-absorbing materials designed by utilizing the metamaterial principle has the advantages of small thickness, wide wave-absorbing frequency band and good wave-absorbing performance.

Description

technical field [0001] The invention relates to a measuring system, in particular to a material electromagnetic parameter measuring system. Background technique [0002] The existing material electromagnetic parameter measurement system is to place the material in a free space, which is a non-contact and non-destructive free space testing method. It uses the transmitting antenna to radiate electromagnetic waves into free space, and then uses the receiving antenna to receive and measure the reflection and transmission signals of the emitted electromagnetic waves by the material, and finally calculate the electromagnetic parameters of the dielectric material through the S parameter. Compared with other measurement methods, the free space measurement method does not have very strict requirements on the shape and process of the test material sample, and only requires the test material to have a uniform thickness and a certain large test area. The free space measurement method a...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01N23/02G01N23/20
Inventor 刘若鹏赵治亚缪锡根刘列
Owner KUANG CHI INST OF ADVANCED TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com