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Measuring method of optical constant of semi-transparent solid material

A technology of solid materials and optical constants, applied in the direction of transmittance measurement, etc., can solve the problem that the double-thickness transmission method cannot meet the measurement of optical constants, etc., and achieve the effect of broadening the application range.

Inactive Publication Date: 2012-10-24
HARBIN INST OF TECH
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  • Application Information

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Problems solved by technology

[0003] The purpose of the present invention is to provide a method for measuring the optical constants of translucent materials to solve the problem that the current double-thickness transmission method cannot satisfy the measurement of optical constants by using two samples of the same thickness

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  • Measuring method of optical constant of semi-transparent solid material
  • Measuring method of optical constant of semi-transparent solid material
  • Measuring method of optical constant of semi-transparent solid material

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specific Embodiment approach 1

[0022] Specific embodiment 1: The method of this embodiment includes the following steps: the method includes the following steps: Step 1: Measuring the transmission spectrum: using a Fourier spectrometer to measure the normal transmission spectrum measurement value T of a single sample single , And then use the Fourier spectrometer to measure the normal transmission spectrum measured value T after superposing two samples with the same thickness L Stack ;

[0023] Step 2: Solve the optical constants:

[0024] Step 2: Assuming the refractive index n of the optical constant of the translucent solid material 0 , Absorption index k 0 , The maximum number of iterations N=10000, the iteration precision e=10 -7 ;

[0025] Step two, select the measurement wavelength λ i The next two transmission spectrum measurements T single And T Stack Bring into the reflectance calculation function, j=j+1, and assume the measurement wavelength λ i The refractive index n of the optical constant of the low...

specific Embodiment approach 2

[0038] Specific embodiment two: explain 1 this embodiment with reference to the figure, the formula described in step 2 of this embodiment The derivation process is as follows: the normal emission ratio of a single layer of material

[0039] R i = ρ i + ρ i T i e - 4 π kL i λ - - - ( 2 - 1 )

[0040] Normal transmittance T i = ( 1 - ρ i ) 2 e - 4 πkL λ i 1 - ρ i 2 e - 8 πkL λ i - - - ( 2 - 2 )

[0041] Among them, the interface reflectivity ρ i Satisfy

[0042] ρ i = ( n i - 1 ) 2 + k i 2 ( n i + 1 ) 2 + k i 2 - - - ( 2 - 3 )

[0043] When the transmitted light enters the two layers of thickness L 1 And L 2 Material, the total normal transmittance of the two layers of material T 1+2 for

[0044] T ...

specific Embodiment approach 3

[0055] Specific implementation mode three: see figure 1 Medium measurement method, using Fourier spectrometer to measure the normal transmission spectrum data T of the single layer sample m1 ; See figure 2 In the measurement method, the Fourier spectrometer is used to measure the normal transmission spectrum T of the superimposed two samples of the same thickness. m2 .

[0056] By solving the optical constants of the sample on a computer loaded with the method of the present invention, image 3 A flowchart of the solution process is given, and the embodiment of the present invention will be further described in detail in combination with it.

[0057] 1) Input initial parameters: wavelength λ i , Single-layer and double-layer normal sample transmission spectrum wavelength λ i Two transmission spectrum values ​​T Single i And T Stack i , Single layer thickness L, initial solution n 0 , K 0 ,, the maximum number of iterations N, j=0, the iteration precision e.

[0058] 2) Solve the ...

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Abstract

A measuring method of optical constant of a semi-transparent solid material aims at resolving the problem that the existing double-thickness transmission method cannot achieve the effect that two samples with identical thickness are utilized to achieve measurement of the optical constant. The method includes step one measuring transmission spectrum and step two calculating optical constant, wherein the step two includes step 1 supposing refraction index of the optical constant of the semi-transparent solid material is n0, absorption index is k0, largest iteration number N is 10000, and iteration accuracy e is 10-7, step 2 selecting and calculating two transmission spectrum measuring value T single and T overlapping under wavelength lambada I, conducting substitution of the two values in a reflectivity calculating function, step 3 substituting calculated rho and single sample transmission spectrum measuring value T single i into an absorption index function, step 4 substituting calculated rhoi and calculated ki into a refraction index calculating function; step 5 evaluating calculation results, namely substituting calculated ni and ki into an evaluation function; and step 6 analyzing calculation results. The measuring method is used for optical constant of the semi-transparent material.

Description

Technical field [0001] The invention relates to a method for measuring the optical constant of a translucent material. Background technique [0002] The transmission method is a common method to obtain the optical constants of translucent solid materials. According to the need to measure the thickness of the sample, it can be divided into two categories: single thickness transmission method and double thickness transmission method. The single-thickness transmission method requires the simultaneous Kramers-Kronig (K-K) dispersion relation, which is a widely used method at present, but the simplified method is used to construct the K-K relation to solve the optical constants and the process is cumbersome. The principle of the double-thickness transmission method using two samples of different thicknesses is simple, without using the KK relationship, and does not need to be simplified, but the key to its realization is to obtain spectral transmission data under different thicknesses...

Claims

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Application Information

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IPC IPC(8): G01N21/59
Inventor 夏新林李栋艾青孙创
Owner HARBIN INST OF TECH
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