Vertical axis silicon micro resonant mode accelerometer based on negative stiffness effect
A negative stiffness effect, accelerometer technology, applied in the direction of velocity/acceleration/shock measurement, measurement of acceleration, microstructure device composed of deformable elements, etc., can solve the difficulty of vertical axis silicon microresonant accelerometer, process Poor compatibility, poor temperature characteristics and other issues, to achieve the effect of easy multi-axis integration, compatible processing technology, and compatible technology
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0037] The present invention will be further described below in conjunction with the accompanying drawings.
[0038] After reading the present invention, modifications to various equivalent forms of the present invention by those skilled in the art fall within the scope defined by the appended claims of the present application.
[0039] like figure 1 As shown, a vertical-axis silicon microresonant accelerometer based on the negative stiffness effect can measure the input acceleration in the vertical plane, including the upper micro-accelerometer structure 100 and the lower glass base 200 . The micro-accelerometer structure 100 is bonded on the glass base 200, the glass base is provided with signal leads, and the electrodes on the micro-accelerometer structure are connected to the corresponding signal leads.
[0040]The micro-accelerometer structure 100 includes a first external mass 101, a first planar resonator 103a arranged inside the first external mass 101 and connected t...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com