The invention relates to the technical field of piezoelectric materials, in particular to a
lead zirconate titanate film and a low-temperature preparation method and application thereof.The preparation method comprises the steps that Ti
metal serves as a
radio frequency target material and is subjected to first
sputtering deposition treatment on a substrate, and a Ti adhesion layer is formed; forming a bottom
electrode on the Ti adhesion layer; taking PbxZr0. 52Ti0. 48O3
ceramic as a
radio frequency target material, carrying out second
sputtering deposition treatment on the bottom
electrode, and carrying out rapid heat treatment to form a PZT seed layer; and carrying out third
sputtering deposition treatment on the PZT seed layer by taking PbxZr0. 52Ti0. 48O3
ceramic as a
radio frequency target material, carrying out rapid heat treatment, and repeating the step to form the
lead zirconate titanate film. According to the method, the substrate tray is not additionally heated in the process of sputtering and depositing the PZT thin
film material, so that the loss and volatilization of PbO are reduced, and the stability of thin film components can be effectively maintained; the PZT seed layer is utilized to provide more
crystal nucleuses, so that the uniform
crystallization of the PZT film is promoted, the
crystallization quality and the electrical property of the PZT film are improved, the
grain boundary defect is reduced, and the
adhesive force and the stability of the film and the substrate are enhanced.