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Fast switching thyristor with subsection width-variable involute multi-finger amplifying gate pole structure

A thyristor and involute technology, which is applied in the field of fast thyristors with multi-finger amplification gate structure with segmented width variable involute, can solve the problems of low tolerance, long gate control opening time, and low surge current.

Active Publication Date: 2012-11-28
HANGZHOU HANAN SEMICON
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Although the thyristor with the amplified gate of the involute structure can improve the working performance within a certain range, since the fingers of the involute multi-fingered amplified gate are very long, the involute multi-fingered amplified gate assists in triggering conduction During the dynamic process, the parasitic resistance of the amplified gate finger limits the trigger current intensity of the thyristor region at the end of the finger, resulting in long gate control turn-on time, low di / dt tolerance, poor gate control turn-on uniformity, and turn-on dynamics. Disadvantages such as poor thermal symmetry, poor high temperature reliability, and low surge current

Method used

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  • Fast switching thyristor with subsection width-variable involute multi-finger amplifying gate pole structure
  • Fast switching thyristor with subsection width-variable involute multi-finger amplifying gate pole structure
  • Fast switching thyristor with subsection width-variable involute multi-finger amplifying gate pole structure

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Embodiment Construction

[0014] The first embodiment of the present invention, such as figure 2 As shown, the fast thyristor is provided with an amplifying gate G1, a cathode K and an anode A. The amplifying gate G1 has an involute radiation distribution, and the amplifying gate G1 is used as a control terminal to amplify or reduce the cathode K current. One end of each finger bar, that is, each involute-shaped amplifying gate G1 is located at the center of the thyristor, and the other end is located at the edge of the thyristor. The involute-shaped amplifying gate G1 is composed of a section with a wider width and a section with a smaller width. The section with a large width is located at the center of the amplifying gate G1, that is, at the center of the thyristor, and the section with a small width is located at the outer side of the amplifying gate G1, that is, at the edge of the thyristor. The width of the segment with a large width is uniform, and the width of the segment with a small width ...

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Abstract

The invention discloses a fast switching thyristor with a subsection width-variable involute multi-finger amplifying gate pole structure. The fast switching thyristor is provided with amplifying gate poles G, a cathode K and an anode A; the amplifying gate poles G are distributed in an involute-shaped radiation manner; and the width of the involute-shaped part at the center of the amplifying gate poles G is greater than the width thereof on the outer side of the amplifying gate poles G. In the fast switching thyristor with a subsection width-variable involute multi-finger amplifying gate pole structure, by changing the involute-shaped gate pole structure, the properties of the fast switching thyristor such as the gate pole control opening time, di / dt tolerance, gate pole control opening uniformity, opening dynamic thermal symmetry, high-temperature reliability, surge current and the like are obviously improved.

Description

technical field [0001] The invention relates to a fast thyristor with segmented width variable involute multi-finger amplifying gate structure. Background technique [0002] The operating frequency of traditional fast thyristors is generally around 400HZ. To increase the operating frequency of fast thyristors, the switching speed of fast thyristors must be increased first, that is, the turn-off time and turn-on time of fast thyristors must be shortened. However, the various electrical parameters of the thyristor are a unity of interdependence and mutual restriction, mutual generation and restraint, and the change of one parameter often leads to the change of many parameters. For example, the shortening of the turn-off time and turn-on time of the device will also cause the deterioration of a series of electrical parameters that are critical to frequency characteristics, such as on-state voltage drop, expansion speed, di / dt, switching loss, and blocking voltage. [0003] In ...

Claims

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Application Information

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IPC IPC(8): H01L29/74H01L29/423
Inventor 王勇
Owner HANGZHOU HANAN SEMICON
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