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A Method of Determining the Number of Hartmann Arrays Using Image Spectrum Containing 4f Systematic Errors

A system error and array number technology, applied in the field of Shack Hartmann wavefront sensor array number, can solve the problems of calculation error, unfavorable operation of sampled data, etc.

Inactive Publication Date: 2014-10-29
CHONGQING UNIV
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  • Application Information

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Problems solved by technology

As far as the detection effect is concerned, the higher the detection accuracy, the better, but the instrument with higher front-end resolution often has a higher price, and a large amount of sampling data is not conducive to calculation, and at the same time, it will also introduce calculation errors, etc.

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  • A Method of Determining the Number of Hartmann Arrays Using Image Spectrum Containing 4f Systematic Errors
  • A Method of Determining the Number of Hartmann Arrays Using Image Spectrum Containing 4f Systematic Errors
  • A Method of Determining the Number of Hartmann Arrays Using Image Spectrum Containing 4f Systematic Errors

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Embodiment Construction

[0033] The present invention will be further described below in combination with specific embodiments and accompanying drawings. The specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0034] In the embodiment, the 4f system of this project is mainly used to determine the lens array of the Shack-Hartmann wavefront sensor in the system.

[0035] In an embodiment of the present invention, the method for determining the Shaker-Hartmann lens array based on the image spectrum containing the systematic error of the 4f system may further comprise the steps:

[0036] step 1 , Generate the optical wavefront and wavefront spectrum to be reconstructed

[0037] Aiming at the influence of the number of sampling points on the accuracy of wavefront reconstruction, a numerical simulation of wavefront reconstruction based on Zernike polynomials is carried out using the covariance matrix method. During the simulation proce...

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Abstract

The invention relates to a method for determining number of Shack-Hartmann sub-apertures in a system by adopting an image spectrum containing a 4f system error. The key steps are as follows: loading an image on an input interface of a 4f system, obtaining an image spectrum containing the system error by a Fourier lens, converting the spectrum of the image into the spectrum which takes a diffraction limit as a coordinate, and determining a front end sampling frequency of a Shack-Hartmann wave-front sensor through a distribution limit of the image spectrum containing the system error according to a sampling theorem. The invention provides an effective method for determining the rational number of arrays of the Shack-Hartmann wave-front sensor in wave-front measurement in the 4f system.

Description

technical field [0001] The invention relates to the field of adaptive optics, in particular to an effective method for determining a reasonable number of Shaker-Hartmann wavefront sensor arrays during wavefront measurement including 4f system errors. Background technique [0002] The all-optical two-dimensional optical negative feedback system is different from the traditional adaptive optics system. Its optical closed-loop system is realized physically. The design of the phase control and correction link is based on the premise of not breaking the physical optical closed-loop. In an all-optical two-dimensional negative feedback system, the form of information is an optical image, and the concept of negative feedback is introduced on the basis of precise control of the optical wavefront phase. Therefore, in the whole process, the precise detection of the optical wavefront phase is one of the core technical links. Adaptive wavefront sensing technology is used in constructing...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J9/00
Inventor 印勇李阳阳
Owner CHONGQING UNIV