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Device and method for measuring junction temperature of LED (light emitting diode)

A measuring method and technology of LED light source, which are applied in measuring devices, measuring heat, thermometers, etc., can solve the problem of unification of accuracy and convenience, and achieve efficient and rapid measurement and performance characterization, convenient and concise measurement, and small error. Effect

Inactive Publication Date: 2015-01-28
SHAANXI UNIV OF SCI & TECH
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  • Description
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  • Application Information

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Problems solved by technology

[0004] The purpose of the present invention is to provide an accurate, reliable, convenient and concise LED junction temperature measurement device and method, which can solve the problem that the accuracy and convenience are difficult to achieve unity in the existing junction temperature measurement method

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  • Device and method for measuring junction temperature of LED (light emitting diode)
  • Device and method for measuring junction temperature of LED (light emitting diode)
  • Device and method for measuring junction temperature of LED (light emitting diode)

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Embodiment Construction

[0022] The present invention will be further described below in conjunction with drawings and embodiments.

[0023] see figure 1 , the measuring device of LED junction temperature of the present invention, comprises thermostat 2, is arranged on the LED light source 4 and integrating sphere 3 in thermostat 2 and is arranged on the spectrum analyzer 5 outside thermostat 2, computer 6 and is used for generating A small current driving power supply 1, one end of the spectrum analyzer 5 is connected to the computer 6, the other end is connected to the integrating sphere 3, the driving power supply 1 and the LED light source 4 are connected to the integrating sphere 3 respectively, and the small current refers to a current of less than 10mA current.

[0024] The semiconductor band gap changes with the junction temperature, resulting in a red shift of the LED chip's luminous wavelength, which leads to a change in the excitation intensity of the phosphor. These processes all affect t...

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Abstract

The invention provides a device and a method for measuring the junction temperature of an LED (light emitting diode). The method mainly comprises the following steps of: controlling the temperature of the LED by a thermostat; obtaining a relative spectrum of the LED by a spectrum analysis system; obtaining a relative spectrum which corresponds to the junction temperature of the LED under the driving of small current at different temperatures; selecting a wave peak or wave trough strength in the relative spectrum as reference; fitting the relationship of the relative spectrum and the reference since the temperature of the thermostat is approximate to the junction temperature at the time under a short time in the process of small current driving, so that an equation can be obtained; and reversely obtaining the junction temperature of the LED due to the equation and the relative spectrum strength under the practical working condition. The method has the characteristics such as the accuracy of a forward voltage method and the contactless measurement of a peak wavelength method, and provides a set of scientific schemes for the high-efficiency and quick measurement and performance expression of the junction temperature of the LED, the optimization study, etc.

Description

technical field [0001] The invention relates to an LED photoelectric detection method, in particular to an LED junction temperature measuring device and method. Background technique [0002] LED (light emitting diode) has many advantages such as small size, long life, high brightness, energy saving and high efficiency, and is considered to be the fourth-generation lighting source to replace incandescent lamps, fluorescent lamps, and high-pressure gas discharge lamps. It has been widely used in signal indication, LCD backlight, display, general lighting and other fields. With the gradual expansion of its application fields, the light decay of LEDs has become a prominent problem, and the junction temperature of LEDs, which is closely related to light decay and life, is particularly important. [0003] Commonly used photoelectric detection methods for LED junction temperature are forward voltage method and peak wavelength method. Since the semiconductor characteristics of the...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01K11/00
Inventor 张方辉邱西振
Owner SHAANXI UNIV OF SCI & TECH
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