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Quad small form-factor pluggable (QSFP) loopback device for test

A four-channel, loopback technology, applied in the field of optical communication systems, can solve problems such as reduced service life and damage to QSFP optical modules, and achieve the effect of solving damage, avoiding aging tests, and avoiding damage

Inactive Publication Date: 2012-12-26
ZTE CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0010] In view of this, the embodiment of the present invention provides a four-channel small pluggable loopback device for testing, which is used to solve the problem that the existing equipment testing is easy to cause damage to the QSFP optical module and reduce the service life.

Method used

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  • Quad small form-factor pluggable (QSFP) loopback device for test

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Embodiment Construction

[0020] Embodiments of the present invention will be described below in conjunction with the accompanying drawings. It should be understood that the embodiments described here are only used to illustrate and explain the present invention, and are not intended to limit the present invention.

[0021] The embodiment of the present invention aims at the problem that the QSFP optical module is easily damaged and the service life is reduced when the equipment is tested in the prior art, and a QSFP loopback device for testing is proposed to replace the QSFP optical module in the equipment testing process Tests are carried out so that the above-mentioned problems in the prior art can be solved.

[0022] image 3 shows the structural block diagram of the test QSFP loopback device provided by the embodiment of the present invention, such as image 3 As shown, the device includes: an electrical interface 31, a signal drive unit 32;

[0023] The electrical interface 31 is used to connec...

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PUM

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Abstract

The invention discloses a quad small form-factor pluggable (QSFP) loopback device for a test. The QSFP loopback device for the test comprises an electrical interface and a signal drive unit, the electrical interface is connected with a to-be-tested device and used for receiving electrical signals namely test signals from the to-be-tested device, the signal drive unit is used to carry out shaping and amplification processes to the test signals received by the electric interface to obtain loopback signals of the electrical signals. The electrical interface is used to send the loopback signals to the to-be-tested device, and therefore the QSFP loopback device can be used to replace a QSFP optical module and optical fibers to transmit signals in the device testing process, the problem that the QSFP optical module is broken due to the fact that the QSFP optical module is plugged and unplugged repeatedly in the device testing process is avoided, and the problem that an unnecessary aging test is carried out in the process of device high-temperature aging test to shorten the service life of the QSFP optical module is avoided, and therefore the problems that in the prior art, in the device testing process, the QSFP optical module is prone to be broken, and the service life of the QSFP optical module is shortened are solved.

Description

technical field [0001] The invention relates to an optical communication system, in particular to a four-channel small pluggable loopback device for testing. Background technique [0002] Quad Small Form-factor Pluggable (QSFP, Quad Small Form-factor Pluggable) optical module is a technical specification proposed to meet the market's demand for higher-density, high-speed pluggable solutions. Density 4-channel full-duplex pluggable optical transceiver interface, the transmission rate of this optical transceiver interface can reach 40Gbps. The QSFP optical module is composed of electrical interface, optical receiver, and optical transmitting laser. The electrical interface includes a pin array (PIN20~PIN38) on the top surface of the interface card and a pin array (PIN1~PIN19) on the bottom surface of the interface card. , the definition of the pins of the electrical interface of the QSFP optical module is shown in Table 1 below, and the specific structure of the electrical in...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04B10/08
CPCH04B10/40
Inventor 管明波
Owner ZTE CORP
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