Method for detecting defect coordinates on color filter

Abstract

The invention discloses a method for detecting defect coordinates on a color filter and relates to the field of industry detection. The method comprises steps of capturing an image of the color filter; processing the image and obtaining a grey scale change critical point on the color filter; capturing a mark of the color filter or an edge of the color filter in accordance with the critical point; and determining a coordinate system of the color filter in accordance with the mark of the color filter or the edge of the color filter and outputting defect coordinates in accordance with the coordinate system. The method has the advantages that a process that a microscope is used for reading a mark is omitted, the coordinate system is established and defect coordinate data are output through image processing, the working period of devices is reduced, the detection efficiency is improved and the detection accuracy of defect coordinates is improved.

Description

technical field [0001] The invention relates to the technical field of industrial detection, in particular to a method for detecting defect coordinates on a color filter. Background technique [0002] In the prior art, the detection steps for the defect coordinates on the color filter are roughly as follows: When the color filter enters the AOI (Automatic Optic Inspection, automatic optical inspection) equipment, a microscope moves to read the Mark (mark), Identify the Mark and establish the coordinate system; TDI CCD (Time Delay Integral Charge Coupled Device) scans the color filter, matches the coordinate system established by reading the Mark through the microscope through image processing, and outputs the defect coordinates. figure 1 is the schematic diagram of AOI equipment, such as figure 1 As shown, the AOI equipment 1 includes: a microscope and a TDI CCD, and the microscope is set on the microscope gantry 11 , and the TDI CCD is set on the TDI CCD gantry 12 . [00...

AI Technical Summary

Problems solved by technology

[0003] The existing detection method has the following defects: after the color filter enters the AOI equipment, the microscope moves to read the AOI Mark, and then the TDI CCD scans the image. The reading of the AOI Mark and the TDI CCD scanning are divided into two steps. This results in many detection steps, a relatively long detection cycle, and an increase in the frequency of equipment failures, which affects the stability of the equipment; the microscope gantry and the TDI CCD gantry belong to two different gantry frames, and there are coordinate errors between them , and the defect coordinates output by the TDI CCD are based on the data calculated by the microscope, so the error of the defect coordinates will be very large, and the defects cannot be processed accurately, which will affect the quality of the product

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