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Method and device for estimating service life of wave tube

A traveling wave tube and life technology, applied in the field of device reliability testing, can solve the problems of high cost, inaccuracy, insufficient life test evaluation of traveling wave tube products, etc., and achieve the effect of improving accuracy and reducing test time.

Inactive Publication Date: 2013-03-13
BEIJING SHENGTAOPING TEST ENG TECH RES INST
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Problems solved by technology

And the function relationship between the stress and the characteristic life obtained by the accelerated stress life test can only be used when the batch consistency is good. Otherwise, the accelerated stress life test should be carried out batch by batch, which requires a long test period and high cost.
Moreover, the life test evaluation of traveling wave tube products is insufficient and inaccurate

Method used

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  • Method and device for estimating service life of wave tube
  • Method and device for estimating service life of wave tube
  • Method and device for estimating service life of wave tube

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Embodiment Construction

[0039] The specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. The following examples are used to illustrate the present invention, but are not intended to limit the scope of the present invention.

[0040] Such as figure 1 As shown, the method for evaluating the life of a traveling wave tube described in the present invention comprises the following steps:

[0041] A: Apply an electrical bias to the signal source, and when the cathode emission current reaches a steady state, monitor and record the test data, including sensitive parameter test values ​​and test time;

[0042] In this step, one or more sensitive parameters are monitored. Applying an electrical bias to the signal source includes: applying a rated electrical stress, inputting an excitation signal, and making the output power of the signal source reach saturation at the initial moment.

[0043] Wherein,...

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Abstract

The invention discloses a method and a device for estimating a service life of a wave tube and relates to the technical field of tests of device reliabilities. The method includes imposing electrical bias on a signal source, monitoring and recording test data including sensitive parameter test values and test time when currents emitted by a cathode are stable; rejecting abnormal values in the test data; modeling the test data after rejection and determining degradation models of sensitive parameters; and determining time of failure criterions of the sensitive parameters by using the degradation models, wherein a minimum is an extrapolation service life of a sample. According to the method and the device for estimating the service life of the wave tube, the test time can be reduced, the estimating accuracy is improved, devices are not needed to be invalid during testing, and the method and the device are suitable for estimating service lives of devices with long service lives.

Description

technical field [0001] The invention relates to the technical field of device reliability testing, in particular to a method and device for evaluating the service life of a traveling wave tube. Background technique [0002] A traveling wave tube is an electric vacuum device used for power amplification of microwave signals. Electric vacuum devices refer to devices that generate signal amplification and conversion effects due to the interaction between electrons and surrounding circuits in a vacuum or gas medium. [0003] Due to the unrepairability of satellites, high requirements are placed on the service life of space traveling wave tubes (traveling wave tubes used in satellites and spacecraft). From the perspective of the development of satellite technology at home and abroad, the life of the satellite is required to reach 10 to 15 years, and the selected space traveling wave tube is also required to reach the corresponding life index. According to the analysis of public...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/25
Inventor 王群勇阳辉陈冬梅钟征宇白桦陈宇孙旭朋
Owner BEIJING SHENGTAOPING TEST ENG TECH RES INST
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