71results about "Vacuum tube testing" patented technology

In a method for estimating the remaining life span of an X-ray radiator that has been installed in an X-ray apparatus and is operational, under specified test conditions and at time intervals, a measurement value that is indicative for the remaining life span of the X-ray radiator is determined and stored in a. A forecasted progression of future measurement values is then forecasted from the instantaneous measurement value and previous measurement values that were determined under identical test conditions, which also are stored in the memory. The forecasted remaining life span of the X-ray radiator is then determined based on the forecasted progression and a limit value that is associated with the individual X-ray radiator, which is stored in the memory. Alternatively or additionally, a characteristic curve that is associated with the measurement value and with the individual X-ray radiator is stored in the memory. In that case, the forecasted remaining life span of the Xray radiator is forecasted based on the instantaneous measurement value, the characteristic curve, and the limit value.

The invention discloses a gain measuring device and method of a cascaded micro channel plate (MCP). The method comprises the following steps that: step (1) after being attenuated, ultraviolet light is emitted to a quartz window, and an ultraviolet Au photocathode is excited to emit photoelectrons; step (2) under the action of electric fields, the photoelectrons are emitted to the input end of the cascaded MCP, and are multiplied by the cascaded MCP, and the multiplied photoelectrons are outputted from the output end of the cascaded MCP, and the multiplied photoelectrons bombard a fluorescent screen under the action of the electric fields, so that bright spots can be generated; step (3) the bright spots on the fluorescent screen are imaged by a CCD or CMOS camera, and a computer acquires the output signals of the CCD or CMOS camera so as to measure the number of the bright spots; and (4) after the number of the bright spots is measured, a circuit is switched to the output current loop of the cascaded MCP, and a nanoammeter is connected in series in the loop so as to measure the output current of the cascaded micro channel plate (MCP), and the gain of the cascaded micro channel plate (MCP) is calculated according to the number of the bright spots and the output current of the cascaded micro channel plate (MCP). The gain measuring method of the cascaded micro channel plate (MCP) provided by the invention has the advantages of simple operation and high accuracy.

The invention discloses a method and a device for estimating a service life of a wave tube and relates to the technical field of tests of device reliabilities. The method includes imposing electrical bias on a signal source, monitoring and recording test data including sensitive parameter test values and test time when currents emitted by a cathode are stable; rejecting abnormal values in the test data; modeling the test data after rejection and determining degradation models of sensitive parameters; and determining time of failure criterions of the sensitive parameters by using the degradation models, wherein a minimum is an extrapolation service life of a sample. According to the method and the device for estimating the service life of the wave tube, the test time can be reduced, the estimating accuracy is improved, devices are not needed to be invalid during testing, and the method and the device are suitable for estimating service lives of devices with long service lives.

The present approach relates to generating one or both of a failure prediction indication for an X-ray tube or a remaining useful life estimate for the X-ray tube. In one implementation, a trained static tube model is used in estimating health (e.g., thickness) of the electron emitter of the X-ray tube, which in turn may be used in predicting remaining useful life of an electron emitter of the X-ray tube.

The invention discloses a method for measuring the passing rate of an electron beam in a microwave vacuum device. The electron beam passing rate of the device is acquired by measuring the heat change of tube body cooling water of an electric vacuum device, the voltage waveforms of the electron beam, and the total current of the electron beam. The method is easy to execute and eliminates various measuring errors with means such as an external power calibration system or the like, achieving high accuracy. By using the method, ceramic material with low mechanical strength is prevented from being used in a component at the collector of the device. Therefore, tube manufacturing difficulty is decreased and yield is increased.

A method and circuit for determining and extinguishing electrical faults includes a power supply, and electrical load, a controller module, and electrical sensors, and when the controller module does not extinguish the electrical fault, another switch blows a fuse.

The invention discloses a method for measuring PDE and Pct spatial two-dimensional distribution of a silicon photomultiplier. The method comprises the following steps: placing the silicon photomultiplier in an electromagnetic shielding box, and installing the silicon photomultiplier on a nanometer displacement platform; using a picosecond pulse laser driver to enable a laser head to irradiate picosecond laser beams, and focusing the picosecond laser beams into light spots on the surface of the silicon photomultiplier through a pinhole light-transmitting sheet in the microscope; powering the silicon photomultiplier by a stabilized power supply, amplifying an output avalanche pulse signal by a high-speed low-noise amplifier, and then inputting the amplified signal into a digital oscilloscopeto observe the waveform of the avalanche pulse; and controlling a nano displacement table to move, calculating a group of PDE and Pct at each position through the total pulse counting rate and the background counting rate under different photon equivalent thresholds, and finally drawing a spatial two-dimensional distribution diagram through multiple groups of PDE and Pct data. The relative lightdetection efficiency and optical crosstalk probability spatial two-dimensional distribution information of the silicon photomultiplier can be obtained at room temperature without low-temperature refrigeration.

The invention relates to an automatic detection device of a magnetron and an operation method thereof. The automatic detection device of the magnetron comprises power measuring equipment, a frequency meter and an integrated display, wherein the power measuring equipment is used for detecting the average power Po of the magnetron, the frequency meter is used for detecting the frequency fo of the magnetron, and the integrated display is used for detecting the electron emission frequency eta of the magnetron. The operation method comprises the following steps of 1, putting the magnetron on a conveying belt; 2, detecting the magnetron, and after detection, enabling the system to automatically record the detection data, wherein the recorded data comprises Po, Ebm and Ib; 3, calculating the electron emission efficiency eta of the magnetron, namely eta=(Po / (Ebm*Ib))*100%; and 4, when the electron emission efficiency eta of the magnetron is greater than or equal to 72%, and the frequency fo of the magnetron detected by the frequency meter is 2450MHz to 2470MHz, judging that the magnetron is qualified. The automatic detection device and the operation method have the advantages that the structure is simple and reasonable, the operation is flexible, the working efficiency is high, and the accuracy is high.

A cathode selection method includes measuring, by using a cathode having an electron emission surface which is a flat surface and a emission area which is limited, a total emission emitted from the cathode; calculating, using a measured total emission value, work function by a Richardson Dash Man's formula; and determining whether or not the cathode has the work function equal to or under an acceptable value.

The object of the present invention is to transmit the position information of a defect that has been specified by means of a circuit pattern inspection apparatus quickly and precisely so that the position information is efficiently used in another apparatus. Marking is carried out on the peripheral area of the defect by use of a charged particle beam irradiation mechanism of the inspection apparatus. The marking realizes sharing of the defect position information with another apparatus. The marking technique includes deposition of a deposit and charging up by means of irradiation of a charged particle beam. The marking in the inspection apparatus allows the defect position information to be transmitted to another apparatus more correctly and easily, and as a result, analysis accuracy is improved and analysis time is shortened.

The invention relates to an online fault detecting system and method for a magnetron. The online fault detecting system comprises a magnetron operating circuit, a collecting device and a display device, wherein the collecting device is connected with the magnetron operating circuit, and the display device is connected with the collecting device. The collecting device comprises a filament current collecting module, a mains supply current collecting module, an anode negative high voltage collecting module, an anode current collecting module and a single-chip microcomputer, wherein the filament current collecting module, the mains supply current collecting module, the anode negative high voltage collecting module and the anode current collecting module are arranged on one circuit board in an integrated mode and independently operate to collect filament current, mains supply current, anode negative high voltage and anode current respectively, and the single-chip microcomputer is used for analog-digital conversion and data processing. The display device is used for receiving collected physical quantities and analyzing the fault reason of the magnetron by judging the threshold ranges of the physical quantities and is also used for displaying fault information. By the adoption of the online fault detecting system and method for the magnetron, multiple physical quantities can be detected at the same time, faults caused during use of the magnetron can be accurately detected, the reliability and the completeness of fault detection are improved, fault information can be visually displayed, and the working environment of workers is improved.

The invention discloses a cathode emission testing apparatus and system for microwave vacuum electronic devices. In the apparatus, an anode and an electrode are mounted on the same flange; a cathode is connected to the electrode; the flange is fixed at an end of a tube; and both ends of the tube are sealed with seal rings. The apparatus and the system in the invention have the advantages of being simple and easy to implement and being capable of very easily and conveniently controlling the distance and depth of parallelism between the anode and the cathode.

The invention provides an online magnetron fault detecting method comprising the steps of acquiring changes of physical quantities like diode anode current, diode anode voltage, filament current and mains current of a piece of magnetron-containing equipment, and comprehensively judging the specific reasons for a magnetron fault, including magnetron leakage, power supply fault, filament breakage, filament emission capability fault, filament aging or magnet steel aging. The online magnetron fault detecting method of the invention has the following characteristics: the detection accuracy is high, the cost is low, misjudgment is not easily caused, and waste of magnetrons and human resources is not caused. The online magnetron fault detecting method can be widely applied to the field of microwave.

The invention discloses a device and a method for double-piece micro-channel plate superposition testing. The testing device comprises a vacuum pump group, an electronic / ion source, and a tube shell and signal detection system for double-piece superposition micro-channel plate test. According to the device, the micro-channel plates of the double-piece superposition structure can be tested, the distance between the two micro-channel plates is controlled, voltage regulation and control are conducted on the two micro-channel plates respectively, the micro-channel plates are convenient to installand take out, damage to the micro-channel plates in the test process can be reduced, the relative positions of the two micro-channel plates can be conveniently converted, and the micro-channel platesdo not need to be reinstalled.

The invention belongs to the microwave test technical field, and specifically provides an input-output characteristic automatic testing method of a travelling wave tube with a pre-stage amplifier; a feedback mechanism is added on the output end (input end of a measured travelling wave tube) of the pre-stage amplifier, thus ensuring the input power of the travelling wave tube to be valid, and obtaining the correct travelling wave tube input-output characteristic testing result; the method can automatically test the travelling wave tube input-output characteristics; a travelling wave tube working linear region and a gradual saturation process can be directly viewed in real time on a computer in a testing process; special parameters can be parsed from the test data, like a saturation point, a 1dB compression point and small signal gain, and the data can be stored for other purposes, thus greatly improving testing accuracy and efficiency.

The invention belongs to the technical field of automatic testing, and provides a method for automatically measuring the gain linearity of a traveling wave tube, so as to solve problems that a conventional measurement method is low in measurement efficiency, and is poor in measurement precision. The method employs an upper computer to control and complete the whole measurement process, and comprises the steps: firstly carrying out the power scanning of a to-be-measured traveling wave tube at a specific measurement frequency point; secondly carrying out the fitting of the input and output power data of the to-be-measured traveling wave tube through high-order polynomial curve fitting, and calculating the gain linearity according to a fitting curve; finally carrying out the frequency scanning, and completing the measurement of the gain linearity at each measurement frequency point (the whole frequency band). Only initialization measurement parameters need to be set in the whole measurement process, and there is no need to carry out manual intervention, thereby greatly shortening the measurement time, and remarkably improving the measurement efficiency. Moreover, the method effectively reduces the unavoidable observation and record errors at a manual measurement link, and greatly improves the measurement precision.

The invention discloses a method for predicting a storage failure of a multi-beam klystron, which relates to the vacuum electronic device technology and comprises the following steps: measuring the cathode emission characteristic of the multi-beam klystron which has no ion pump and is stored for 40 to 45 days; recording a cathode emission current value in the first three minutes according to 15 seconds of a sampling time interval; and drawing a curve that the cathode emission current value changes along with time, wherein if the curve that the cathode emission current value changes along with time occurs a phenomenon of declining first and then rising, and the proportion of declining is more than 10 percent of a rated value, then the probability of occurring the storage failure of the device can be predicted over 60 percent after being stored for more than half a year. The method of the invention is suitable for the multi-beam klystron without the ion pump, and can also be popularized to other microwave vacuum devices without the ion pump, such as a klystron without the ion pump, a traveling wave tube without the ion pump and the like.

The invention relates to a CRT display, especially a method for detecting and activating kinescope ageing of a CRT display, the method comprises observing whether a smearing phenomenon is existed when the brightness of the kinescope is not high, then the brightness and the contrast are increased, under the condition that each pole voltage of the kinescope is normal; if the smearing phenomenon is existed, dismounting the casing of the display and pulling out a base of the kinescope, after applying rated voltage on the filament of the kinescope for 3-5 minutes, connecting a modulating electrode using a black meter pen of a mechanical multimeter 1K shift, connecting red, blue and green three electrodes respectively by the red meter pen; when the testing resistance value is between 5K and 10K, applying 8V-9V voltage on the filament, replacing 110V voltage with a power supply voltage of the TV set itself, electrifying for 3-8 minutes, reactivating one time after 10 minutes, the kinescope is recovered in normal immediately. The method can not only reduce the maintenance cost, but also simplify the maintenance operation steps.

The invention belongs to the technical field of traveling wave tube high efficiency, and particularly relates to a method for measuring an electron energy distribution curve at a collector inlet of a traveling wave tube. The traveling wave tube is tested through low-work-ratio electron beam emission, on the premise that safety is guaranteed, the work ratio of the traveling wave tube is gradually increased till the work ratio of the traveling wave tube cannot be continuously increased, and at the moment, measurement data are final measurement data. And the final measurement data is used for guiding the iterative optimization design and debugging of a high-efficiency collector, so that the iterative development times and the design period of the development of the high-efficiency traveling wave tube are reduced, and the development cost of the high-efficiency traveling wave tube is reduced favourably. Moreover, the method is convenient and simple to operate, a complicated test system does not need to be manufactured, and time and experiment cost are greatly saved.

The present approach relates to generating one or both of a failure prediction indication for an X-ray tube or a remaining useful life estimate for the X-ray tube. In one implementation, a trained static tube model is used in estimating health (e.g., thickness) of the electron emitter of the X-ray tube, which in turn may be used in predicting remaining useful life of an electron emitter of the X-ray tube.

The invention relates to a method based on X-rays quantity change to judge running state for the vacuum arc extinguish chamber inner. It includes the following steps: while doing power frequency withstand voltage test, exerting high voltage to the two ends of the vacuum arc extinguish chamber; running off electron from the cathode surface caused by field emission; these electrons post bombing anode under the action of high voltage electric filed; basing on bremsstrahlung mechanism to generate X-rays; measuring them; if their releasing quantity is not stable, this can explain that the inner vacuum degree reaches safety lower limit, or electricity life reaches critical. The invention can realize wireless measuring without any electric connection with the tested vacuum arc extinguish chamber which not only has safe and reliable operation, but also can realize online monitoring for the vacuum circuit breaker.

A method for detecting a short circuit fault in a multi-level inverter circuit is provided. The multi-level inverter circuit includes a plurality of single phase branches each including of switches. The method includes steps outlined below. At least one detecting pulse sequence is transmitted to the switches of each of the single phase branches. Whether a conducting path is formed in any of the single phase branches is determined according to the detecting pulse sequence. When the conducting loop is formed, respective position of one or more malfunctioned switch in the single phase branches is located according to a path of the conducting loop. A short-circuit detection device and a three-phase three-level inverter circuit are also disclosed herein.

The thermionic valve tester (10) has a casing (11) and three valve sockets (12) each of which is adapted to receive and has terminals for connection with the electrode pins of different types of thermionic valves. The thermionic valve tester (10) also has a display (13) comprising a series of LED lights, three user operated buttons (16), and a single power supply socket or terminal (14) which supplies power to all components of the valve tester and which is adapted for connection to a low voltage DC power supply lead. Internally, the thermionic valve tester (10) has a plurality of voltage regulators each with a switchable connection to at least one valve electrode terminal of the valve sockets (12) and a memory in which is stored the tests and the performance criteria for different types of thermionic valves. A controller controls connection of the voltage regulators with the terminals of the valve sockets (12) and the voltages applied to the terminals and also monitors current flow in the thermionic valve during testing. The thermionic valve tester is a small, portable unit which is simple and easy to use and enables people, other than qualified specialists and audio technicians, to regularly monitor valve performance.

The invention relates to a magnetron online fault detection system and a fault detection method, comprising a magnetron working circuit, a collection device connected to the magnetron working circuit, and a display device connected to the collection device; the collection device includes an integrated On the circuit board and independently working to collect filament current, mains current, anode negative high voltage, anode current filament current acquisition module, mains current acquisition module, anode negative high voltage acquisition module, anode current acquisition module and used for analog Single chip microcomputer for digital conversion and data processing; the display device is used to receive the collected physical quantity, analyze the fault cause of the magnetron and display the fault information by judging the threshold range of the physical quantity. The invention can detect multiple physical quantities at the same time, can accurately detect the faults that occur when the magnetron is in use, improves the reliability and completeness of fault detection, and can display fault information intuitively and vividly, improving the work of the staff surroundings.

The invention provides a photomultiplier linear range testing device and method. The photomultiplier linear range testing device comprises a light source, a light source driver, a light splitting camera obscura, an integrating sphere, a light guide piece, a testing camera obscura, a testing electronics system and a computer. The light source emits light and irradiates the light-splitting dark box.The light splitting camera obscura is an opaque box body with a light inlet and a light outlet, light beam splitting output is carried out through the light splitting camera obscura, and the light beam is irradiated into the integrating sphere through the light outlet to be uniformly mixed. A light outlet of the integrating sphere is connected with a light inlet of the test camera obscura througha light guide piece. The test electronics system is used for providing high voltage for working of the photomultiplier and measuring an output signal of the photomultiplier. The computer is used forcontrolling the operation of the test device, and is used for controlling the light source driver, controlling the electric device in the light splitting dark box to realize light splitting, controlling and configuring the test of the test electronics system, reading a measurement value of the test electronics system and generating a test result after processing.

A method for operating an electric machine having a power inverter, which is electrically connected to a relative ground potential, and a ground differential voltage between the relative ground potential and a reference ground potential is monitored, and if the ground differential voltage reaches an upper limit value, the electric machine is operated in a current-delivering operating state, and if the ground differential voltage reaches a lower limit value, the electric machine is operated in a non-current-delivering operating state.

Ground and test devices (G&TD) have an interchangeable test configuration using serially releasably mountable first and second ground assemblies and releasably mounted primary arm conductors thereby allowing for onsite field modification of a base test unit for use to test either the load side or line side terminals without requiring two separate base test devices providing an economic and less bulky test solution for end users.

The detection device includes an input end, a power supply circuit, an inverter circuit unit, a voltage regulation unit, an output unit, and a detection unit. The input end is in use for inputting AC. The power supply circuit is in use for stepping down voltage, and rectifying AC to DC. The inverter circuit unit is in use for inverting DC to AC, and for stepping up voltage. The voltage regulation unit is in use for adjusting the input voltage for the inverter circuit unit; and the output end is in use for outputting the stepped up AC. The detection unit includes a first voltage detection unit, and a second voltage detection unit. The first voltage detection unit is in use for measuring the input voltage of the inverter circuit unit, and the second voltage detection unit is in use for measuring the output voltage of the inverter circuit unit. It is convenient for the detection device to carry out detecting.

The invention discloses a space traveling wave tube working state electron beam motion state analysis method. On the basis of electron motion data obtained by a finite element method, a fan-shaped thin disc model for electron beam morphological analysis and a fan-shaped ring thin disc model for electron beam velocity analysis are provided to obtain changes of electron beam morphology and velocityalong a slow wave structure of a space traveling wave tube spiral line. According to the method, the problems that the morphology of the electron beam cannot be accurately quantified and the radial velocity change and the section velocity distribution of the electron beam cannot be analyzed in the prior art are solved.