4results about "Vacuum tube testing" patented technology

The application discloses a kind of household microwave oven magnetron filament loss fault determination methods, comprising: microwave output power original value of multiple moments of microwave oven and the voltage ripple original value of the two ends of magnetron filament determine time domain denoising voltage ripple value and smooth filtering power value;According to the time domain denoising voltage ripple value of multiple moments, determine voltage ripple time domain distortion rate;Calculate power fluctuation variance ratio;Iterative calculation is calculated for a preset number of times, obtain multiple iteration coupling eigenvalues;According to the average of multiple iteration coupling eigenvalues, determine loss gradient quantization value;According to loss gradient quantization value, determine calibration fault probability;According to loss gradient quantization value and corresponding loss gradient threshold value and calibration fault probability and probability threshold value, determine loss fault information.The application can realize the accurate positioning of magnetron filament micro-aging fault and make the on-site repair work more safe and reliable.The application also discloses a system, an electronic device and a storage medium for implementing the above method.

A measurement device for measuring a photocathode current of a photomultiplier tube, the measurement device includes: (a) a voltage amplifier configured to amplify a shunt resistor voltage proportional to the photocathode current; (b) a leakage tolerant circuit configured to generate a first leakage tolerant voltage, based on a first amplified voltage and a first reference voltage having an absolute value that exceeds an absolute value of a leakage associated with the measurement device; (c) a voltage to current transducer that is configured to convert the first leakage tolerant voltage to a first leakage tolerant current; and (d) an output unit that is configured to convert the first leakage tolerant current to an output voltage that is indicative of the photocathode current.

The invention relates to the technical field of device performance testing, in particular to a vacuum diode scaling testing method and device based on the similarity principle, and the method comprises the steps: determining the inherent parameters and target testing conditions of a to-be-tested vacuum diode prototype, generating a test control parameter set of the prototype according to the inherent parameters and the target test condition; based on the test control parameter set of the prototype machine, scaling the geometric dimension of the prototype machine at equal ratio by using a target similarity principle, and determining a scaling model of the prototype machine and a corresponding scaled working condition; and based on the scaled working condition, testing the scaling model to obtain working parameters and performance of the scaling model, and according to the working parameters and the performance, carrying out backstepping to obtain working parameters and performance of the prototype. Therefore, the problems that the test cost is relatively high and the test efficiency and the safety cannot be effectively guaranteed due to the fact that the equal-ratio test of the high-power vacuum diode prototype needs to be manufactured in a large size and requires an extremely high voltage in the prior art are solved.

The present disclosure provides a testing station, testing module and testing method for testing a plurality of image intensifier tubes. In an embodiment, a testing station includes a first testing module and a second testing module. The first testing module has a first input connector, a first output connector and a plurality of first testing sections each configured to test an image intensifier tube. The second testing module has a second input connector, a second output connector and a plurality of second testing sections each configured to test an image intensifier tube. The first testing module and the second testing module are configured to be removably attached to each other in a first orientation and a second orientation. The first input connector is connected to the second output connector in the first orientation, and the second input connector is connected to the first output connector in the second orientation.