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274results about "Contact testing/inspection" patented technology

Electrical wiring device with protective features

The present invention is directed to an electrical wiring device for use in an electrical distribution system. The device includes a plurality of line terminals configured to terminate the plurality of line conductors and a plurality of load terminals configured to terminate the plurality of load conductors. The protective circuit assembly includes at least one fault detector configured to generate a fault detection signal based on electrical perturbations propagating on at least one of the plurality of line terminals or at least one of the plurality of load terminals. A device integrity evaluation circuit includes a timing circuit coupled to the source of AC power by way of the plurality of load terminals and configured to generate a time measurement. The device integrity evaluation circuit is configured to reset the time measurement if the protective circuit assembly generates the fault detection signal during a predetermined test interval in the properly wired condition. The device integrity evaluation circuit is configured to generate a device integrity fault signal when the time measurement exceeds a predetermined threshold. A circuit interrupter assembly includes movable contacts configured to be latched into a reset state in response to a reset stimulus. The movable contacts are configured to be driven into a tripped state in response to the fault detection signal or the device integrity fault signal.
Owner:PASS SEYMOUR

Electrical wiring device with protective features

The present invention is directed to an electrical wiring device for use in an electrical distribution system. The device includes a plurality of line terminals configured to terminate the plurality of line conductors and a plurality of load terminals configured to terminate the plurality of load conductors. The protective circuit assembly includes at least one fault detector configured to generate a fault detection signal based on electrical perturbations propagating on at least one of the plurality of line terminals or at least one of the plurality of load terminals. A device integrity evaluation circuit includes a timing circuit coupled to the source of AC power by way of the plurality of load terminals and configured to generate a time measurement. The device integrity evaluation circuit is configured to reset the time measurement if the protective circuit assembly generates the fault detection signal during a predetermined test interval in the properly wired condition. The device integrity evaluation circuit is configured to generate a device integrity fault signal when the time measurement exceeds a predetermined threshold. A circuit interrupter assembly includes movable contacts configured to be latched into a reset state in response to a reset stimulus. The movable contacts are configured to be driven into a tripped state in response to the fault detection signal or the device integrity fault signal.
Owner:PASS SEYMOUR
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