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Inspection jig and contact

A technology for inspecting fixtures and contacts, which is applied to electronic circuit testing, instruments, and electrical measurement, can solve problems such as complex processing and rising production costs, and achieve the effects of simplified structure, easy design, and shortened construction period

Inactive Publication Date: 2013-04-03
西川秀雄
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, as the number of components increases, the processing of the passive needle (reference number 3 of Document 10) becomes complicated, resulting in an increase in production cost.

Method used

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  • Inspection jig and contact
  • Inspection jig and contact
  • Inspection jig and contact

Examples

Experimental program
Comparison scheme
Effect test

Embodiment approach 1）

[0072] Such as figure 1 As shown, in the inspection jig 1 according to the embodiment of the present invention, a plurality of contacts 10 are held by the contact holder 20 and are detachably attached to the electrode plate 42 . figure 2 The electrode 41 shown is arranged coaxially with the coil spring 12 of the contact 10 on the electrode plate 42 and fixed to the supporting body 43 . The support body 43 is fixed to the jig substrate 45 together with the connector 46 . The electrode 41 and the connector 46 are wired by a wire 44 to form the electrode part 40 . The inspection jig 1 is mounted on the inspection device and electrically connected through the connector 46 . The tip 111 of the contact 10 is pressed against the inspection terminal of the printed circuit board to be inspected, so that the electrical characteristics can be measured.

[0073] exist figure 2 and Figure 3, the internal structure is described. The contact 10 is formed by arranging a contact pin 11 ...

Embodiment approach 2）

[0087] When inspecting the inspection terminals of a minute interval smaller than the interval of the electrodes 41, it can be dealt with as follows: figure 2 Among them, the first guide hole 211 and the second guide hole 221 are shifted non-coaxially, so that the contact pin 11 is slightly inclined, and the contact pin 11 and the coil spring 12 are arranged in series to reduce the distance from the adjacent tip 111 . In addition, when there is a partial design change on the printed circuit board to be inspected and the position of the inspection terminal is slightly displaced, sometimes it can be dealt with by replacing the first guide plate 21 and the second guide plate 22 . When the displacement distance is large, the lengths of the guide plate 25 and the stylus 11 , the position of the large-diameter portion 113 , and the like can be changed, although not shown.

Embodiment approach 3）

[0089] When inspecting a through-hole printed circuit board, there may be a through hole area (through hole land) as an inspection terminal. There is a hole in the through-hole area, into which the protruding part 112 of the contact 10 enters to cause poor contact, thus requiring a contact pin 11 whose diameter of the protruding part 112 is larger than that of the hole. The load, wire diameter, and outer diameter of the coil spring 12 also increase. When mixed with thin-diameter contacts 10 used for inspection terminals in non-porous surface mount areas, it is also possible to increase the range of electrodes 41 with the same diameter, thereby increasing the ease of design and manufacture. When the physical strength of the coil spring 12 with a large load is not enough, it is preferable to use Figure 4C cut in the circumferential direction.

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PUM

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Abstract

Disclosed is an inspection jig (1), wherein a contact (10) in which a conductive contact pin (11) and a coil spring (12) are arranged in series or overlapping one another is thereby held in a contact holder (20) and presses on an electrode (41) connected to the inspection jig and presses on a terminal to be inspected to thereby make conductive contact. The coil spring (12) is composed of a relay end (122), a constant spring part (123), and an electrode end (121). In the terminal, the electrode end (121) curves in the center direction, is cut off near the center, and makes conductive contact with the electrode (41). The contact holder (20) holding the contact (10) is mounted in an electrode part (40) comprising the electrode (41) coaxial to the coil spring (12). As a result, reliable conductive contact is achieved between a contact and an electrode which can not only be manufactured easily and inexpensively but are also easy to maintain. In addition, an inspection jig and a contact which pass electricity to a printed wiring board that improves the electrical characteristics of the contact are realized.

Description

technical field [0001] The invention relates to a contact and a test fixture which are in contact with test terminals installed on electronic components such as printed circuit boards. Background technique [0002] For inspection of printed circuit boards figure 1 Describe the general structure. The inspection fixture 1 is arranged between the printed circuit board to be inspected and the inspection device to ensure electrical conduction and to inspect electrical characteristics such as resistance value. The contact holder 20 and the electrode part 40 are connected to the inspection device through the connector 46, wherein the contact holder 20 is used to hold a plurality of contacts 10 that are in electrical contact with the inspection terminal of the printed circuit board to be inspected, and the electrode part 40 is used for To support the contact holding body 20 and have electrodes in electrical contact with the contact 10 . The structure formed so that the contact ho...

Claims

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Application Information

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IPC IPC(8): G01R1/067G01R1/073G01R31/28H05K3/00
Inventor 西川秀雄
Owner 西川秀雄
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