Infrared thermal imaging temperature measuring method by correcting surface emissivity through image segmentation

Abstract

The invention discloses an infrared thermal imaging temperature measuring method by correcting surface emissivity through image segmentation. The infrared thermal imaging temperature measuring method includes: aiming at infrared images of a target object surface, wherein the infrared images are shot by a thermal infrared imager, using an image segmentation algorithm, distinguishing areas with different emissivities in the infrared images; based on the emissivities of different areas measured by an emissivity measuring instrument, establishing emissivity distribution array corresponding to image pixels of the infrared images one to one, using the emissivity distribution array to correct gray level array of the infrared images of the target object surface, thus obtaining infrared images which fit emissivity distribution characteristics of the target object surface, thus calculating and obtaining temperature field distribution of the target object surface. Due to the fact the existing infrared thermal imaging temperature measuring method is not capable of accurately setting the emissivity distribution of the target object surface, errors of temperature measuring results are big. The infrared thermal imaging temperature measuring method by the correcting surface emissivity through the image segmentation is capable of effectively reducing the errors, the temperature measuring results are enabled to fit actual temperature distribution conditions of the target object surface. The infrared thermal imaging temperature measuring method by the correcting surface emissivity through the image segmentation is simple in requirement for equipment and easy to achieve.

Description

【Technical field】 [0001] The invention relates to an infrared temperature measurement method, in particular to an infrared thermal imaging temperature measurement method for correcting surface emissivity through image segmentation. 【Background technique】 [0002] Because infrared thermal imaging temperature measurement technology has the advantages of fast temperature measurement speed, large temperature measurement area, high resolution, non-contact, and no interference with the temperature field of the measured surface, it is widely used in industrial processing, remote sensing detection, medical diagnosis, anti-theft security, etc. , non-destructive testing and many other fields. Infrared thermal imaging temperature measurement technology regards the surface of the target object as a gray body with uniform radiation characteristics, and regards the emissivity of the entire target object surface as a certain value from 0 to 1, and then according to Planck's law, the temper...

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Problems solved by technology

[0008] For the first method, because the general manual only simply classifies the emissivity of objects according to the different types of materials, and as mentioned above, the emissivity of the object surface is related to many factors, even for the same material, the surface roughness, manufacturing process, Factors such as surface cleanliness and oxidation degree will affect the emissivity. Therefore, the emissivity parameters obtained according to the manual can be used as a reference, but there must be errors in the infrared temperature measurement results obtained based on this; When correcting the emissivity, if the surface of the target object is complicated, resulting in large changes in the radiation characteristics in different areas of the same plane, at this time, only in the place where the emissivity is corrected by point thermometers or thermocouples or where the coating is small The temperature measurement result is close to the actual temperature of the target object, and there are large errors in other areas of the temperature measurement surface; in method 4, it is first required to coat a large area on the surface of the target object, and in many actual temperature measurement occasions, and Target objects are not allowed to do this, and in large area measurements, this method is very inconvenient

In summary, when using infrared thermal imaging cameras for radiation temperature measurement, in view of the influence of emissivity, when the surface structure of the target object is complex and the emissivity of materials in different regions varies greatly, there will be large errors in the temperature measurement results

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