Test head
A test head and double head technology, applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., can solve the problems of complex structure, many connection links, and high cost of detection connectors, and achieve simple structure, fewer connection links, and small errors. Effect
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0010] one This kind of test head includes a shell 4, two insulators (2, 3) are arranged in the inner cavity of the shell 4, there is a concentric through hole in the middle of the two insulators, a double-ended pin 1 is arranged in the through hole, and one end of the pin is connected to the Test the connection of the RF coaxial connector, and the other end is connected with the testing equipment; the outer wall of the shell 4 is covered with a screw sleeve 5, the outer wall of the shell 4 is provided with an annular groove, and the inner wall of the corresponding screw sleeve 5 is provided with an annular groove. A snap ring 6 is arranged between the grooves.
[0011] Such as figure 1 Shown: a test head, including: pin 1, insulator 2, insulator 3, shell 4, screw sleeve 5, snap ring 6 according to the size of the outer diameter of both ends of the pin 1, press them into the insulator 2 in turn, the insulator 3. There is a knurling or barb in the middle of the thinner end o...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com