Time-of-flight mass spectrometer
A mass analysis device, time-of-flight technology, used in time-of-flight spectrometers, measuring devices, analyzing materials, etc.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment
[0243] Next, an embodiment of the TOFMS according to the present invention based on the above principle and a specific configuration example of a reflector used therefor will be described. Figure 12 is a schematic structural diagram of the TOFMS of the present embodiment, Figure 13 yes Figure 12 A schematic perspective view of reflector 4 in .
[0244] exist Figure 12 Here, the sample-derived ions generated by the ion source 1 are given initial energy by the electric field formed by the voltage applied to the accelerating electrode 2 from the accelerating voltage source 7 , and thrown into the flight space formed in the flight tube 3 . A reflector 4 composed of a plurality of electrodes is arranged in the flight tube 3 , and each ion is decelerated and reflected by an electric field formed by the reflector 4 . The reflected and returned ions reach the detector 5, and the detector 5 outputs a detection signal corresponding to the amount of the reached ions. A predetermi...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com