Numerical-value-simulation-based automatic ballistic limit acquisition method for satellite protective structure
A protective structure and ballistic limit technology, applied in the direction of electrical digital data processing, special data processing applications, instruments, etc., can solve problems such as human error, high analysis cost, and long analysis cycle, and achieve the goal of shortening the acquisition cycle and reducing costs Effect
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0024] The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.
[0025] The present invention is a method for automatically acquiring the ballistic limit of a satellite protective structure based on numerical simulation. First, a user establishes a working directory and a protective structure model k file, copies the impact simulation header file and the protective structure model k file into the working directory, and then fills in the Ballistic Limit automatically obtains the configuration file, starting by e.g. figure 1 The steps shown are for automatic acquisition of ballistic limits. In the automatic ballistic limit acquisition configuration file, the parameters related to the limit point search are given, including: the working directory, the file name of the relevant k file, the two initial values x1 and x2 for the automatic limit diameter search, and the convergence error a; in addition, due to th...
PUM
![No PUM](https://static-eureka.patsnap.com/ssr/23.2.0/_nuxt/noPUMSmall.5c5f49c7.png)
Abstract
Description
Claims
Application Information
![application no application](https://static-eureka.patsnap.com/ssr/23.2.0/_nuxt/application.06fe782c.png)
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com