Unlock instant, AI-driven research and patent intelligence for your innovation.

ddr2 read and write operation digital delay chain process-temperature-voltage controller circuit

A DDR2, read and write operation technology, applied in the direction of digital memory information, instruments, static memory, etc., can solve the problems of DQS sampling DQ in read operation, glitch in DQS in read operation, unsatisfactory DQS in read operation, etc.

Active Publication Date: 2015-08-05
KUNSHAN HUINING ELECTRIC
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] 1. During the write operation of the DDR2 controller, the data DQ signal is completed in the write operation clock domain. This clock is the clock obtained by delaying the system DDR2 clock by 3 / 4 through the write operation clock digital delay chain. If the existing DDR2 The write operation clock digital delay chain controller dynamically adjusts the write operation clock, especially when adjusting the write operation digital delay chain near the positive and negative edges of the write operation clock, the write operation clock may have glitches, the period may decrease, and the data DQ signal is valid The time is reduced, and in severe cases, the data DQ may not meet the time window required by the DDR2 specification;
[0005] 2. During the write operation of the DDR2 controller, the DDR2 memory receives DQ data in the DQS clock domain of the write operation. This clock has the same phase as the DDR2 system clock ddr2_clk. If the DDR2 write operation is controlled according to the existing DQS digital delay chain The device dynamically adjusts the write operation DQS signal, especially when the write operation DQS is near the positive and negative edges, the write operation DQS may have glitches, the cycle may be reduced, and the effective time of the DQS signal is reduced. In severe cases, DQS may not meet the requirements of the DDR2 specification time window;
[0006] 3. During the read operation of the DDR2 controller, the DDR2 controller receives data in the DQS clock domain of the read operation. This clock is the clock obtained by delaying the DQS signal sent by the DDR2 memory by 1 / 4 of the phase of the DQS digital delay chain of the read operation. If According to the existing DDR2 read operation DQS digital delay chain controller dynamically adjusts the read operation DQS signal, especially when the read operation DQS is near the positive and negative edges, the read operation DQS may have glitches, the cycle may be reduced, and the effective time of the DQS signal is reduced. Small, resulting in a problem with the sampling DQ of the read operation DQS after the delay. In severe cases, the DQS of the read operation may not meet the time window required by the DDR2 specification

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • ddr2 read and write operation digital delay chain process-temperature-voltage controller circuit
  • ddr2 read and write operation digital delay chain process-temperature-voltage controller circuit
  • ddr2 read and write operation digital delay chain process-temperature-voltage controller circuit

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0027] The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments. In this paper, the initial delay series of the clock-locked digital delay chain is 63, and the chip output and input pin delay and board-level delay are zero. As an embodiment, the described embodiment is only an embodiment of the present invention, not Full examples. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0028] The invention includes a DDR2 controller command detector, a DDR2 process-temperature-voltage adjustment controller, a DDR2 write operation clock digital delay chain controller, a DDR2 write operation DQS digital delay chain controller and a DDR2 read operation DQS digital delay chain controller, Please refer to the attached figure 1 . In this circuit, when the ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a DDR2 read-write operation digital delay chain technology-temperature-voltage controller circuit. Commands transmitted between a DDR2 controller and a DDR 2 memory are detected; a synchronous digital delay chain enable signal is output to a DDR2 read-write operation digital delay chain controller; and when a DDR2 controller command detector detects a refresh command, a technology-temperature-voltage controller circuit outputs a refreshed DDR2 read-write operation digital delay chain enable signal to the DDR2 read-write operation digital delay chain controller in the premise of locking of a DDR2 read-write operation digital delay chain. In DDR2 controller command refreshment, DQS and DQ signals are in an ineffective state and safe, reliable and high-precision DDR2 read-write operation digital delay chain dynamic refreshment is realized.

Description

technical field [0001] The present invention relates to the application of DDR2 (Double Data Rate, double rate synchronous dynamic random access memory) digital delay chain controller circuit for read and write operations, such as DDR, DDR2, DDR3, etc., which belong to the high-speed DDR2 read and write operation digital delay chain controller circuit technology field. Background technique [0002] With the continuous improvement of the performance of the system-on-chip SOC chip, the data throughput is also increasing, making the DDR2 (Double Data Rate, double-rate synchronous dynamic random access memory) controller more and more widely used. [0003] When the chip changes in process, temperature and voltage, the existing DDR2 read and write operation digital delay chain controller technology uses a dynamic update of the read and write operation digital delay chain, and does not take into account the DQ and DQS between the DDR2 controller and the DDR2 memory. state. The d...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G11C11/4063
Inventor 吕新浩孙翼高鹏马涛
Owner KUNSHAN HUINING ELECTRIC
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More